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MPI Fully Automatic Probe Systems

MPI Fully Automatic Probe Systems

MPI is offering two different fully-automatic test solutions:

Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonic Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test  (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.

Over the past decade, the semiconductor industry has been challenged with increasing demands for accurate on-wafer measurements for Device Characterization during the Modeling and New Technology Development processes. Current 300 mm solutions compromise on either measurement accuracy or automation capabilities. Overcoming these challenges, MPI now introduces the TS3500 probe station series configurable with unique MPI WaferWallet making it the most advanced fully-automatic system on the market. The combined capabilities now offer the customer unequaled measurement flexibility with test automation while significantly reducing the overall cost of test. MPI’s WaferWallet also incorporates simple and convenient handling of multiple wafer types and sizes.

MPI Fully Automated Probe Systems

300mm Automatic Probe Station
300mm Automatic Probe Station
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