High Power Probe Station | High Power Manual Probe Systems  |  Characterizing Silicon Photonics | Manual Wafer Prober |  Wafer Probing Station |  Manual Probe Stations |  Wafer Probing Station  

High Power Manual Probe Systems |  Manual Probe Stations

Probe Station | Probe Station

150 mm Wafer Prober |  High Power Probe Station  

MPI High Power Manual Probe Systems

MPI High Power Manual Probe Systems

previous arrow
next arrow

MPI High-Power device characterization systems are specifically designed for on-wafer high power device testing. MPI TS150-HP and TS200-HP probe systems provide a complete 150 mm and 200 mm on-wafer solution. They are engineered to achieve low contact resistance measurements of power semiconductor under wide range of temperatures.

Features & Benefits

Manual Probe Systems | Manual Probe Stations | High Power Probe Station | Wafer Probing Station | 150 mm Probe Station| 200 mm Probe Station | Manual Probe System

Click to Enlarge

Air-Bearing Stage

The MPI air-bearing stage design, with simple single-handed puck control, provides unsurpassed convenience of operation for fast XY navigation and quick wafer loading without compromising accurate and fine positioning capability with the additional fine and accurate 25x25mm XY-Theta micrometer movement.

Ambient Chucks | Cold Chucks | Thermal Chuck | Temperature Chuck | Hot Chuck | Coaxial Chucks | 3kV Triaxial Ambient Chucks

Click to Enlarge

10kV Coaxial or 3kV Triaxial Ambient Chucks

Chuck options include MPI’s 10kV coaxial or 3kV triaxial ambient chucks or various ERS thermal chucks to support temperature measurement up to 300 °C.  The thermal touch controller is designed to be mounted on the prober itself for quick and convenient operation.

Click to Enlarge

HV/HC Probes

MPI high power probing solutions include dedicated high voltage and high current probes which use MPI propriety multi-contact tips for reduced contact resistance. MPI’s high voltage probes are capable of low leakage current measurements during high voltage tests up to 3kV triaxial or 5 & 10 kV in coaxial set-ups.

Click to Enlarge

Safe and Accurate

The standard manual High Power probe systems are configured with a DarkBox providing an interlock for safety and EMI-shielding capability  in order to insure low-noise, accurate , and safety measurements.

Click to Enlarge

Instruments Integration

TS150-HP/TS200-HP can be configured with variety of instrument connection packages, which consists of necessary high voltage / high current probes and cabling accessories for optimal connection to the test instruments such as Keysight B1505 (3 kV or 10 kV) or Keithley  2600-PCT-XB, including integration of 8020 High Power Interface Panel.

A chuck top tray, with electrical connection for biasing, is an easy add-on for any high power TS150-HP chuck. The tray is designed to retain Fluorinert™ liquid for a cost effective anti-arcing solution.

*Fluorinert is a trademark of 3M Company, USA.
Product Menu Close