{Probe System|Probe Station|300mm Probe Station|300mm Probing System|Automatic Wafer Prober} | {Probe Systems|Probe Stations|300mm Probe Stations|300mm Probing System|Automatic Prober System|Automatic Probe Station|300 mm Wafer Probers|300 mm Wafer Probing|Automatic Wafer Prober}  | {Probe Systems|Probe Stations|300mm Probe Stations|300mm Probing System|Automatic Prober System|Automatic Probe Station|300 mm Wafer Probers|Wafer Probe|Automatic Wafer Prober} | {Probe System|Probe Station|300mm Probe Station|300mm Probing System|Automatic Probe System|Automatic Probe Station|300 mm Wafer Prober|300 mm Wafer Probing|Automatic Wafer Probe} | {Probe Systems|Wafer Probe Stations|300mm Probe Stations|300mm Probing System|Automatic Prober System|Automatic Probe Station| 300 mm Wafer Probers|300 mm Wafer Probing|Automatic Wafer Prober} | {Probe System|Probe Station|300mm Probe Station|300mm Probing System|Automatic Probe System|Automatic Probe Station|300mm Wafer Probing|300 mm Wafer Probing|Automatic Wafer Prober} | {Probe Systems|Probe Stations|300mm Probe Stations|300mm Probing System|Automatic Prober System|Automatic Probe Station|300 mm Wafer Probers|300 mm Wafer Probing|Automatic Wafer Probe Station}

  200 mm Probe Station | 300mm Probing System
150 mm Probe Stations | 300mm Probing System
300 mm Wafer Probing |  Automatic Probe Stations

MPI Fully Automatic Probe Systems

MPI is offering two different fully-automatic test solutions:

Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonic Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test  (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.

Over the past decade, the semiconductor industry has been challenged with increasing demands for accurate on-wafer measurements for Device Characterization during the Modeling and New Technology Development processes. Current 300 mm solutions compromise on either measurement accuracy or automation capabilities. Overcoming these challenges, MPI now introduces the TS3500 probe station series configurable with unique MPI WaferWallet™ making it the most advanced fully-automatic system on the market. The combined capabilities now offer the customer unequaled measurement flexibility with test automation while significantly reducing the overall cost of test. MPI’s WaferWallet™ also incorporates simple and convenient handling of multiple wafer types and sizes.