Automated Probe System | High Power Manual Probe Systems | MPI | Low leakage Probes | High Power Device Characterization | High Power Device Characterization | Automated Probe System
Wafer Probe Station | Manual Wafer Prober
Probe Systems | Probe Station
Probe Stations | silicon substrate
TS2000-HP – Advanced High Power Solution
MPI’s automated TS2000-HP provides reliable on-wafer high power device measurement over wide-temperature range and measurement capability up to 3 kV (triax) / 10 kV (coax) and 600 A (pulsed). Advanced ShielDEnvironment™ offers low-noise and shielded test environment.
Features & Benefits
Interlocked enabled safety light curtain to protect user from accidental high voltage shock by shutting down the instrument through interlock system.
The system has rear doors, protected by interlock as well in order to provide easy and convenient initial measurement set-up.
MPI ShielDEnvironment™ is a high performance local environmental chamber providing excellent EMI- and light-tight shielded test environment for ultra-low noise, low capacitance measurements.
To prevent arcing between chuck and platen, TS2000-HP platen is specially designed with MPI advanced ArcShield™.
High Voltage Probes (HVP)
Low leakage probes specially designed to withstand high voltage up to 10 kV (coaxial) and 3 kV (triaxial). Choice of various connectors options such as Keysight Triax/UHV, Keithley Triax/UHV, SHV or Banana.
High Current Probe (HCP)
High performance probes specially designed for on wafer measurement of high current up to 200 A (pulse). MPI multi-fingers high current probes are single piece construction to efficiently handle high current and provide low contact resistance.
Optional Anti-Arcing LiquidTray™
Specially designed anti-arcing LiquidTray™ can be used for arcing suppressing by simply place on the high power chuck surface. Wafers can be safely placed inside the tray to submerge in the liquid for arcing free high voltage test.
Hot/Cold Wafer Swaps at Set Temperatures
The automated single wafer loader and the safety test management provide a unique capability to load/unload wafers at any chuck temperatures. Cooling down or heating up to ambient is not required anymore to load or unload a wafer. This saves major down time and increases the overall MPI Test Systems efficiency significantly. Necessary settings are protected by a convenient supervisor log-in procedure.
MPI TS2000-HP shares the same standard features, such as, thermal chuck integration, Safety Test Management™, automated single wafer loader, vibration isolation, and integrated prober control of the TS2000-SE system.
Feel the Difference
Software Suite SENTIO
MPI automated engineering probe systems are controlled by a unique and revolutionary, multi-touch operation SENTIO
For RF applications, there is no need to switch to another software platform – the MPI RF calibration software program QAlibria® is fully integrated with SENTIO