ARMMS 2019
November 18-19, 2019 Wyboston, UK Participating Division Advanced Semiconductor Test Please add this program to your calendar. ⇒ Register Now[Subject]: Your recipe of on-wafer calibration for accurate mm-wave characterisation of advanced silicon...
SEMICON Europa 2019
November 12-15, 2019 Messe München, Germany Booth No. B1101 Participating Division: Probe Card Technologies | Thermal
Interlligent UK’s 2019 RF & Microwave Design Seminar
November 7, 2019 Cambridge, UK Participating Division Advanced Semiconductor Test
COMCAS 2019
November 4-6, 2019 Tel Aviv, Israel Please visit us at Booth No. 72Participating Division Advanced Semiconductor Test Please add this program to your calendar. ⇒ Register Now[Subject]: Recent Advances in mm-wave Characterization, Calibration and de-embedding...
SWTest Asia 2019
October 17-18, 2019Hsinchu Sheraton Hotel, TaiwanPlease visit us at Booth No. 510Participating Division: Probe Card Technologies
Laser Taiwan 2019
October 16-18, 2019TaiNEX 1, Taipei, TaiwanPlease visit us at Booth No. M332Participating Division: Photonics Automation
Automotive Testing Expo 2019
Exhibition on October 22-24, 2019 The Suburban Collection Showplace, Novi, Michigan, USA Please visit us at Booth No. 8034 Participating Division: Thermal
European Microwave Week 2019
Exhibition on October 1-3, 2019 Porte de Versailles Paris, France Please visit us at Booth No. 770/765 Participating Division: Advanced Semiconductor Test
International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM) Tutorial Session Tabletop Exhibition
09:30 am – 5:00 pm, Sunday, September 29, 2019Kyoto International Conference Center, Room A Please visit us at Booth No. B11Participating Division: Advanced Semiconductor Test
SEMICON Taiwan 2019
Exhibition on September 18 - 20, 2019 TaiNEX 1, Taipei, Taiwan Please visit us at Booth No. K2360 Participating Division: Probe Card Technologies | Photonics Automation | Advanced Semiconductor Test | Thermal Test
SEMICON West 2019
Exhibition on July 9-11, 2019Moscone Center, San Francisco, CA, USAPlease visit us at Booth No. 1842 in South HallParticipating Division: Probe Card Technologies | Thermal Test
Centre for Power Electronics Annual Conference 2019
Exhibition on July 3-4, 2019Holywell Park Conference Centre, Loughborough University, UKBooth No. 2Participating Division: Advanced Semiconductor Test
93rd ARFTG Microwave Measurement Conference
Exhibition on June 7, 2019The Westin Boston Waterfront, Boston, Massachusetts, USAParticipating Division: Advanced Semiconductor Test
IEEE MTT-S International Microwave Symposium 2019
June 4-6, 2019Boston Convention and Exhibition Center (BCEC), Boston, Massachusetts, USAPlease visit us at Booth No. 742Participating Division: Advanced Semiconductor Test | Thermal Test
Semiconductor Wafer Test Workshop
Workshop on June 2-5, 2019Rancho Bernado Inn, San Diego, CA, USAPlease visit us at Booth No. 25Participating Division: Probe Card Technologies
Space Tech Expo 2019
Exhibition on May 20-22, 2019Pasadena Convention Center, California, USAPlease visit us at Booth No. 4027參加部門: Thermal Test
The 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD)
Exhibition on May 19 – 23, 2019 The new Shanghai Marriott Hotel Parkview, Shanghai, China Please visit us at Booth A1 Participating Division: Advanced Semiconductor Test
IS-Test Workshop 11
Workshop on May 6-7, 2019 Munich Airport Marriott Hotel, Freising, GermanyParticipating Division: Probe Card Technologies[Presentation] Probe Card High Speed Test And The Application [Presenter] Cary Chen (MPI Corporation), Mohammed Ibrahim (htt Group) [Date] Monday,...
32nd IEEE International Conference on Microelectronic Test Structures (ICMTS)
Exhibition on March 18-21, 2019Kitakyushu International Conference Center, Fukuoka, JapanPlease visit our booth in Exhibition Lobby (Sub-Foyer), 2nd Floor參加部門: Advanced Semiconductor Test
SEMICON CHINA 2019
Exhibition on March 20-22, 2019New International Expo Centre, Shanghai, ChinaPlease visit us at Booth No. 3151, Hall N3參加部門: Probe Card Technologies | Photonics Automation | Advanced Semiconductor Test | Thermal Test
OFC 2019
2019年3月5-7日美國聖地牙哥展覽中心展位號碼 #1823參加部門: Thermal Test | Photonics Automation
SEMICON Europa 2018
November 13-16, 2018 Messe München, Munich, Germany Booth No. A4-102 參加部門: Probe Card Technologies | Thermal Test | Advanced Semiconductor Test
Asia-Pacific Microwave Conference 2018
November 6-9, 2018 Kyoto International Conference Center (ICC Kyoto), Japan Please visit our booth in Conference Room A and workshop in Room J, 2nd Floor 參加部門: Advanced Semiconductor Test Please add this workshop to your calendar. → Register Now [Subject]:...
TPCA Show 2018
October 24-26, 2018 Taipei Nangang Exhibition Center, Taipei, Taiwan Please visit us at Booth No. K-325 參加部門: Probe Card Technologies
Automotive Testing Expo 2018
Exhibition on: October 23-25, 2018 Hall B, The Suburban Collection Showplace, Novi, MI, USA Please visit us at Booth No. 8034 參加部門: Thermal Test
Laser Taiwan 2018
Exhibition on: October 17-19, 2018 Hall 1, TWTC Nangang Exhibition Center, Taipei, Taiwan Please visit MPI in VCSEL 3D Sensing Pavilion 參加部門: Photonics Automation
2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)
October 16, 2018 Sheraton San Diego Hotel and Marina, California, USA Please come join the program in Bell Aire Ballroom North 參加部門: Advanced Semiconductor Test Please add the program to your calendar. ⇒ Register Now [Subject]: 7. High Frequency Characterization 7.1...
European Microwave Week 2018
Exhibition on September 25-27, 2018 Ifema Feria de Madrid, Madrid, Spain Please visit us at Booth No. 22 參加部門: Advanced Semiconductor Test
China International Optoelectronic Expo (CIOE)
Exhibition on: September 5-8, 2018 Shenzhen Convention & Exhibition Center, Shenzhen, China Please visit us at Booth No. 2538、2539 (Hall 2) 參加部門: Thermal Test
SEMICON TAIWAN 2018
Exhibition on September 5-7, 2018 TWTC Nankang Exhibition Hall, Taipei, Taiwan Please visit us at Booth No. K2360 參加部門: Probe Card Technologies | Photonics Automation | Thermal Test | Advanced Semiconductor Test
