{MPI探針台|探針台| 150mm探針台| 200mm探針台| RF探針|晶圓探針台|手動探針台} | {探針系統|探針台| 300mm探針台| 300mm探針系統|晶圓探針測試|手動探針台|晶圓探針機| 300mm |晶圓探針|晶圓檢驗} | {MPI探針台|探針台| 150毫米探針台|射頻探針台| 300毫米探針台|晶片探針台|手動探針台} | {RF探針台|探針台| 300mm探針台| 300mm探測系統|手動探針系統|手動探針台|晶圓探針台| RF晶圓探針|晶圓測試} | {RF探針系統|探針台| 300mm探針台| Wafer探針台| Wafer探針測試|手動探針台| 晶圓探針機| 300毫米晶圓探針|晶圓測試} | {MPI探針台|探針台| 150 mm探針台| 200 mm探針台| RF探針台|晶片探針台|手動探針台} [/ wpts_spin]

150 mm Probe Stations | Probe Stations

RF Probe Station | Wafer Test 

Wafer Probe Station | 150 mm Probe Stations

MPI Manual Probe Systems

MPI TS150 - 150 mm Manual Probe System

MPI TS200 - 200 mm Manual Probe System

MPI TS300 - 300 mm Manual Probe System

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Standard Open Systems

MPI TS150, TS200 & TS300 manual probe systems are open, easy to use and cost effective yet highly accurate. These systems are designed for precision analysis of substrates and wafers up to 150, 200 and 300mm.

 

They may be configured to support a wide variety of applications such as Failure AnalysisDesign Validation/IC Engineering, Wafer Level Reliability, MEMS, High Power and Device Characterization and Modeling as well.

High Power Systems

The MPI TS150-HP and TS200-HP probe systems are specifically designed for on-wafer high power device characterization testing up to 10 kV and 600 A. Dedicated chuck designs, connectors and cables are engineered to achieve low contact resistance measurements of power semiconductor under wide range of temperatures.

 

TS150-HP

MPI TS150 Manual Probe System - Vibration Isolation Platform

TS200-HP

MPI Dark Box Option for MPI Manual Probe Stations

Dedicated Systems for mmW and THz Application

MPI TS150–THZ engineering probe system is a dedicated, cost effective, manual probe system designed especially for precision analysis of substrates and 150 mm wafers in sub THz range.  The system is extremely stable, with a large probe platen, and a low-profile design. Each of these essential elements are required to support a wide variety of RF and mmW applications such as broadband up to 220 GHz, banded solutions up to 1.1THz, load-pull and RF noise. 

TS150-AIT and TS200-THZ probe system expand MPI one-of-a-kind system solutions for emerging THz applications by adding active impedance tuner integrations on the same probe stations. These two systems are the industry’s first explicitly designed 150 mm and 200 mm probe systems providing accurate tests for the combination of requirements for mm-wave, THz, and automated impedance tuner applications with best possible measurement directivity.

TS150-THZ

Wafer Test Solution

TS200-THZ

MPI TS200-THZ - 200 mm Manual Probe System for mmW & THz Measurements

Shielded Systems

The MPI TS200-SE and TS300-SE probe system incorporate the ShielDEnvironment™ providing optimal EMI shielding which allows ultra-low noise device on-wafer measurements mainly for Device Characterization and Modeling applications.

The modular design concept of all MPI manual probe systems allows a unique upgrade path towards reduced cost of ownership.

TS200-SE

Wafer Test Solution

TS300-SE

MPI TS300-SE - 300 mm Manual Probe System with ShielDEnvironment™

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