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MPI RF Calibration Substrates

TS150 TS200 TS300 Optic Tilting
TS150 TS200 TS300 Optic Ttilting
TS150 TS200 TS300 Optic Ttilting
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MPI offers variety of calibration standards developed to address specific application needs of the on-wafer RF and microwave measurements.

The AC-series of calibration substrates offers up to 26 sets of standards for wafer-level SOLT, LRM probe-tip calibration for GS/SG and GSG probes.

Five coplanar lines provide the broadband reference multiline TRL calibration as well as accuracy verification of conventional methods.

Right-angled reciprocal elements are added to support the SOLR calibration of the system with the right-angled configuration of RF probes. The calibration substrate for wide-pitch probes is also available.