Semiconductor Test Probes | Semiconductor ATE | Probe Stations | Semiconductor Auromatic Test Equipment | Probe Station | Semiconductor Probe Systems | Semiconductor Wafer Test | Micromanipulators | Probe Station Manufacturers | Probe Station Micromanipulator | 半導體測試探針| 半導體ATE | 探針台| 半導體自動測試設備| 探測站| 半導體探針系統| 半導體晶圓測試| 微操縱器| 探針台製造商| 探針台微操縱器

MPI Probe Station | Manual Probe Station | Semiconductor ATE | RF Probe Station | Semiconductor Test Probes | Wafer Probe Stations | Manual Probe Station

先進半導體測試解決方案

了解客戶測試需求

持續追求創新

降低測試成本

A201-1114-FFB81C

工程用探針台系統

遠見卓識

無與倫比的價值

品質卓越

AST Slide 3_A_.fw

A201-1114-FFB81C

射頻探針

: 26 – 110 GHz

獨特

MEMS

針尖

小針痕探針

多針點探針

高功率

A201-1114-FFB81C

Applications

Manual Probe Systems

Automated Probe Systems

RF Probes