TS3000-SiPH Automated Probe System | 300 mm Wafer Probers
300 mm Probe Station | Manual Probe System
Probe Systems | TS3000-SiPH Automated Probe System
High Power Device Characterization | silicon substrate | Micropostioners | Manual Probe System | High Power Production Test Measurements | High Power Probes | High Power Probe Station
TS2000-DP – DarkBox High Power Solution
Features & Benefits
Probe Cards & MicroPositioners
TS2000-DP provides access up to 12x High Voltage (up to 3 kV triaxial or 10 kV coaxial) or 4x multi-fingers High Current up to 400 A MicroPositioners.
Many single probes, dedicated probe card holder for anti-arcing high power probe cards are making the system an ideal choice for High Power device characterization measurements.
The system is equipped with ArcShield™ to prevent any possible arcing between the chuck and the probe platen.
The anti-arcing probe card has a capability to apply high-pressure around the DUT and by using the Paschen law to prevent arcing between the pads.
Specially designed anti-arcing LiquidTray™ can be used for arcing suppressing by simply placing it on the high power chuck surface. Wafers can be safely placed inside the tray to submerge in the liquid for arcing free high voltage test.
The MPI chucks are designed for up to 10 kV (coaxial) at 300°C.
TS2000-DP can be configured with variety of instrument connection packages, which consists of necessary high voltage / high current probes and cabling accessories for optimal connection to the test instruments such as Keysight B15005 (3 kV or 10 kV) including integration of the Module Selector or Keithley 2600-PCT-XB, including integration of 8020 High Power Interface Panel.
Software Suite SENTIO
MPI automated engineering probe systems are controlled by a unique and revolutionary, multi-touch operation SENTIO
For RF applications, there is no need to switch to another software platform – the MPI RF calibration software program QAlibria