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優化晶圓測試更多資訊
先進的全面性高效率探針卡解決方案 - LED測試，分類和處理更多資訊
高性能探針系統
光子學和LED測試解決方案
高速分揀系統 - 更多資訊
射頻探針
工程探針系統先進半導體測試解決方案 - ThermalAir TA-5000
系列溫度測試設備更多資訊
環境溫度模擬測試箱(Test Chambers)
快速溫度循環測試
溫度範圍 -80°C 至 +225°C – 高效節能
Probe Cards
MPI Announced TITAN™ Multi-Contact Probe for RF IC Characterization
Advanced Semiconductor Test
New
MPI Corporation introduces the TITAN™ Multi-Contact Probe, the further advances of company’s TITAN™ RF probing technology for challenges of testing modern Si RF ICs.
TITAN™ Multi-Contact Probe Online Design Capture Form
Advanced Semiconductor Test
New
Request for quote now! – Use Online Design Capture Form to build your probe by choosing RF signal (S), logic (L) and power supply (P) channels according to your IC pad layout.
New 300 mm Fully-Automatic Probe Systems Series with WaferWallet™
Advanced Semiconductor Test
New
MPI introduces the fully-automatic TS3500 probe station series, configurable with unique MPI WaferWallet™ for simple and convenient handling of multiple wafer types and sizes.
The 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD)
May 19 – 23, 2019
Advanced Semiconductor Test
Shanghai Marriott Hotel Parkview, Shanghai, China
Booth A1
Event
Space Tech Expo 2019
May 20-22, 2019
Thermal Test
Pasadena Convention Center, California, USA
Booth No. 4027
Event
Semiconductor Wafer Test Workshop
June 2 – 5, 2019
Probe Card Technologies
Rancho Bernado Inn, San Diego, CA, USA
Booth No. 25
Event
IEEE MTT-S International Microwave Symposium 2019
June 4 – 6, 2019
Advanced Semiconductor Test | Thermal Test
Boston Convention and Exhibition Center, MA, USA
Booth No. 742
Event
93rd ARFTG Microwave Measurement Conference
June 7, 2019
Advanced Semiconductor Test
The Westin Boston Waterfront, Boston, MA, USA
Event
Centre for Power Electronics Annual Conference 2019
July 3 – 4, 2019
Advanced Semiconductor Test
Holywell Park Conference Centre, Loughborough University, UK
Booth No. 742
Event
