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優化晶圓測試更多資訊
先進的全面性高效率探針卡解決方案 - LED測試，分類和處理更多資訊
高性能探針系統
光子學和LED測試解決方案
高速分揀系統 - 更多資訊
射頻探針
工程探針系統先進半導體測試解決方案 - ThermalAir TA-5000
系列溫度測試設備更多資訊
環境溫度模擬測試箱(Test Chambers)
快速溫度循環測試
溫度範圍 -80°C 至 +225°C – 高效節能
Probe Cards
Thermal Accessories that Meet Your Temperature Test Need
Thermal Test
New
MPI Thermal provides full array of intuitive functioning accessories for the ThermalAir users to flexibly and accurately test their components or device at the thermal test workstation.
MPI Thermal New ThermalAir TC-100 Gas Chiller
Thermal Test
New
Discover the evolutionary ThermalAir TC-100 Gas Chiller which focuses on localized temperature inducing of continuous -80°C Clean Dry Air.
Datasheet now available.
Enhanced Vertical Solution 80
Probe Cards
New
Probe your device with MPI’s Enhanced Vertical Solution 80 to enjoy the benefit of stable performance. Contact us for detailed information on how we can probe more efficiently and effectively.
MPI Announced TITAN™ Multi-Contact Probe for RF IC Characterization
Advanced Semiconductor Test
New
MPI Corporation introduces the TITAN™ Multi-Contact Probe, the further advances of company’s TITAN™ RF probing technology for challenges of testing modern Si RF ICs.
TITAN™ Multi-Contact Probe Online Design Capture Form
Advanced Semiconductor Test
New
Request for quote now! – Use Online Design Capture Form to build your probe by choosing RF signal (S), logic (L) and power supply (P) channels according to your IC pad layout.
New 300 mm Fully-Automatic Probe Systems Series with WaferWallet™
Advanced Semiconductor Test
New
MPI introduces the fully-automatic TS3500 probe station series, configurable with unique MPI WaferWallet™ for simple and convenient handling of multiple wafer types and sizes.
Centre for Power Electronics Annual Conference 2019
Exhibition on July 3 - 4, 2019
Advanced Semiconductor Test
Holywell Park Conference Centre, Loughborough University, UK
Booth No. 2
Event
SEMICON West 2019
July 9 - 11, 2019
Probe Card Technologies | Thermal Test
Moscone Center, San Francisco, CA, USA
Booth No. 1842 in South Hall
Event
SEMICON Taiwan 2019
Sept 18 – 20, 2019
Probe Card Technologies | Photonics Automation | Advanced Semiconductor Test | Thermal Test
TaiNEX 1, Taipei, Taiwan
Booth No. K2360
Event
