LCD Driver Probe Card
PC201-1114-FFB81C
Advanced Cobra Probe Card
WAT Parametric Probe Card Low Leakage

優化晶圓測試

先進的全面性高效率探針卡解決方案

PA201-1114-FFB81C
Fully Auto Laser Diode Prober

先進晶圓 / 光電元件自動化檢測和視檢技術

專為光電, 雷射, 及

LED

產業

全方位打造量測方案

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A201-1114-FFB81C
TS2000-SE.fw
TS3000-SE.fw

先進半導體測試解決方案

工程用探針台系統

射頻探針

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ThermalAir

系列

溫度測試設備

環境溫度模擬試驗箱

(Test Chambers)

快速溫度循環測試

溫度範圍

-80°C

+225°C

– 高效節能

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MPI Introduces Unique NoiseShield™ Option for 1/f (Flicker) & RTN Measurements

Advanced Semiconductor Test

New

MPI introduced a new NoiseShield™ option, which provides excellent EMI-shielding, low impedance grounding and shortest possible cable lengths to reduce parasitic capacitance and to maximize the test system roll-off frequency.

TS2000-SE Configured with the New MPI THZ-Selection

Advanced Semiconductor Test

New

MPI THZ-Selection converts TS2000-SE system into a dedicated, mmW and THz probe station, as the first one on the market.

The New MPI ITS25-THZ IMPACT™ Test Solution

Advanced Semiconductor Test

New

Enabling cost effective mmW and THZ testing with the highest possible measurement accuracy.

Factsheet now available.

Thermal Accessories that Meet Your Temperature Test Need

Thermal Test

New

MPI Thermal provides full array of intuitive functioning accessories for the ThermalAir users to flexibly and accurately test their components or device at the thermal test workstation.

MPI Thermal New ThermalAir TC-100 Gas Chiller

Thermal Test

New

Discover the evolutionary ThermalAir TC-100 Gas Chiller which focuses on localized temperature inducing of continuous -80°C Clean Dry Air.

Datasheet now available.

Enhanced Vertical Solution 80

Probe Cards

New

Probe your device with MPI’s Enhanced Vertical Solution 80 to enjoy the benefit of stable performance. Contact us for detailed information on how we can probe more efficiently and effectively.

MPI Announced TITAN™ Multi-Contact Probe for RF IC Characterization

Advanced Semiconductor Test

New

MPI Corporation introduces the TITAN™ Multi-Contact Probe, the further advances of company’s TITAN™ RF probing technology for challenges of testing modern Si RF ICs.

TITAN™ Multi-Contact Probe Online Design Capture Form

Advanced Semiconductor Test

New

Request for quote now! – Use Online Design Capture Form to build your probe by choosing RF signal (S), logic (L) and power supply (P) channels according to your IC pad layout.

2019 Asia-Pacific Microwave Conference (APMC)

December 11-13, 2019

Advanced Semiconductor Test

Sands Expo & Convention Centre, Level 4, Marina Bay Sands, Singapore

Booth No. B4

Event

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