優化晶圓測試
先進的全面性高效率探針卡解決方案
先進晶圓 / 光電元件自動化檢測和視檢技術
專為光電, 雷射, 及LED產業
全方位打造量測方案
先進半導體測試解決方案
工程用探針台系統
射頻探針
ThermalAir系列溫度測試設備
環境溫度模擬試驗箱(Test Chambers)
快速溫度循環測試
溫度範圍-80°C至+225°C – 高效節能
Ultra-High Performance Probe Card
With the Lowest Cost of Ownership
Delivering Extreme Test Capabilities
APMC 2023
Advanced Semiconductor Test
展覽
日期: 2023年12月5 - 8日
攤位號碼: A3
地點: 台北國際會議中心 (TICC)
美國國際消費性電子展 CES 2024
Thermal
展覽
日期: 2024年1月9 - 12日
攤位號碼: 1817 (Westgate) ; 5677 (LVCC)
地點: Westgate Las Vegas & Las Vegas Convention and World Trade Center (LVCC)
DesignCon 2024
Thermal | Advanced Semiconductor Test
展覽
日期: 2024年1月31 - 2月1日
攤位號碼: 1438
地點: 聖塔克拉拉會議中心
MPI SENTIO® 和 QAlibria® 現已涵蓋四端口射頻系統自動校準
Advanced Semiconductor Test
News
新竹2022年12月13日 — MPI Corporation的 先進半導體測試部門 是半導體射頻測試解決方案的市場領導者及創新先鋒，該部門演示了無人值守的四端口射頻校準和量測，由 MPI 完全整合的射頻校準和探針台系統控制軟體套件——新版本的 QAlibria® and SENTIO® 支援。
TS2000-IFE Series – THZ Selection
Advanced Semiconductor Test
News
THZ-Selection converts the TS2000-IFE into a dedicated, RF, mmW, THZ and load-pull probe station, as first one on the market without compromising measurement directivity and accuracy at wide temperature range from -60°C to +300°C.
Celadon Multisite Tile-on-Card™ Production Probe Card
Celadon Systems
News
Functional Test, 200C, Production Probe Card
Celadon Cryogenic Minitile™
Celadon Systems
News
Cryogenic, 4K and 77K, Positioner Mounted, 22 pin Probe Card
Celadon VC20™, 45e™ Probe Card Adaptor, and Insertion Tool
Celadon Systems
News
Modular, -65C to 200C, 48 channel, probe card and adaptor, used for Modeling, Characterization, Parametric Test, and WLR testing
Celadon VC43™ and P9000 Production Parametric Probe Card
Celadon Systems
News
Modular, -65 to 200C, 100 channel, Probe Card
The Latest in mmWave and THz Test and Measurement Technology
Advanced Semiconductor Test
News
This eBook is a collection of articles on the various innovations in measurement methods and equipment that has been developed to address these higher frequencies ranging from mmWave up to 1.1 THz. (This eBook was published by Microwave Journal)