Probe Card
LCD Driver Probe Card
PC201-1114-FFB81C
Advanced Cobra Probe Card
WAT Parametric Probe Card Low Leakage

優化晶圓測試

先進的全面性高效率探針卡解決方案

Photonics Automation
PA201-1114-FFB81C
Fully Auto Laser Diode Prober

先進晶圓 / 光電元件自動化檢測和視檢技術

專為光電, 雷射, 及LED產業
全方位打造量測方案

AST
AST Slide 3_B_.fw
A201-1114-FFB81C
TS2000-SE.fw
TS3500-SE.fw

先進半導體測試解決方案

工程用探針台系統

射頻探針

Thermal
T201-1114-FFB81C.png
T201-1114-FFB81C.png

ThermalAir系列溫度測試設備

環境溫度模擬試驗箱(Test Chambers)

快速溫度循環測試

溫度範圍-80°C至+225°C – 高效節能

Celadon
LCD Driver Probe Card
PC201-1114-FFB81C

Ultra-High Performance Probe Card

With the Lowest Cost of Ownership

Delivering Extreme Test Capabilities

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Probe Card
Photonics Automation
Advanced Semiconductor Test
Thermal Test
Celadon
Probe Card
Advanced Semiconductor Test
Celadon
Photonics Automation
Thermal Test