Free Webinar
Advanced Semiconductor Test
Webinar
Tiny PICs with Huge Impact: Meeting the Challenges of Photonic Integrated Circuits testing for next-generation networks.
Time: June 17, 2020; 11 am EDT | 4 pm GMT
Source Measurement Solution Case Study for VCSEL / LD Testing Application
Photonics Automation
New
See how MPI teamed up with Tektronix to provide highly reliable source measurement solutions targeting the VCSEL / Laser Diode (LD) testing applications.
MPI Thermal Temperature Test Solutions - New Videos
Thermal Test
Video
Check out the new released ThermalAir Series Temperature Forcing Systems presentation videos. Discover how the Thermal technology brings temperature to your test workstation.
ERS electronic adds PRIME 200 to their AirCool
Advanced Semiconductor Test
New
ERS electronic and MPI Corporation are now offering a 200 mm version of their popular thermal chuck AirCool
Your recipe of on-wafer calibration for accurate mm-wave characterisation of advanced silicon devices
Advanced Semiconductor Test
Video
This presentation discusses solutions for both metrology-grade and production-suitable calibration methods and will share some experimental results and practical recommendations.
MPI Corporation at ICMTS 2020
Advanced Semiconductor Test
Video
A short video introducing MPI’s products and expertise showing how our systems have been developed to address a wide range of challenges surrounding device characterization and measurement analysis.
MPI TITAN™ Probe DC to 220 GHz
Advanced Semiconductor Test
New
The pioneering TITAN™ 220 GHz probe was developed in cooperation with Anritsu as an integrated component of the breakthrough VectorStar ME7838G 220 GHz broadband system.
MPI Introduces Unique NoiseShield™ Option for 1/f (Flicker) & RTN Measurements
Advanced Semiconductor Test
New
MPI introduced a new NoiseShield™ option, which provides excellent EMI-shielding, low impedance grounding and shortest possible cable lengths to reduce parasitic capacitance and to maximize the test system roll-off frequency.
TS2000-SE Configured with the New MPI THZ-Selection
Advanced Semiconductor Test
New
MPI THZ-Selection converts TS2000-SE system into a dedicated, mmW and THz probe station, as the first one on the market.
Enhanced Vertical Solution 80
Probe Cards
New
Probe your device with MPI’s Enhanced Vertical Solution 80 to enjoy the benefit of stable performance. Contact us for detailed information on how we can probe more efficiently and effectively.
MPI Announced TITAN™ Multi-Contact Probe for RF IC Characterization
Advanced Semiconductor Test
New
MPI Corporation introduces the TITAN™ Multi-Contact Probe, the further advances of company’s TITAN™ RF probing technology for challenges of testing modern Si RF ICs.
Advanced Semiconductor Test
New
June 27-29, 2020
Shanghai New International Expo Centre, China
SEMICON China 2020
Booth No. E3166, Hall E3
