LCD Driver Probe Card
PC201-1114-FFB81C
Advanced Cobra Probe Card
WAT Parametric Probe Card Low Leakage

優化晶圓測試

優化晶圓測試

先進的全面性高效率探針卡解決方案

先進的全面性高效率探針卡解決方案

PA201-1114-FFB81C
Fully Auto Laser Diode Prober

先進晶圓 / 光電元件自動化檢測和視檢技術

先進晶圓 / 光電元件自動化檢測和視檢技術

專為光電, 雷射, 及

專為光電, 雷射, 及

專為光電, 雷射, 及

LED

LED

產業

產業

全方位打造量測方案

AST Slide 3_B_.fw
A201-1114-FFB81C
TS2000-SE.fw
TS3000-SE.fw

先進半導體測試解決方案

先進半導體測試解決方案

工程用探針台系統

工程用探針台系統

射頻探針

射頻探針

T201-1114-FFB81C.png
T201-1114-FFB81C.png

ThermalAir

ThermalAir

系列

系列

溫度測試設備

溫度測試設備

環境溫度模擬試驗箱

環境溫度模擬試驗箱

(Test Chambers)

(Test Chambers)

快速溫度循環測試

快速溫度循環測試

溫度範圍

溫度範圍

-80°C

-80°C

+225°C

+225°C

– 高效節能

– 高效節能

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Thermal Test

New

Take a tour of the exclusive MPI Thermal 3D Virtual Booth to explore the full product portfolio of ThermalAir TA-Series of Temperature Testing Systems.

MPI Thermal Temperature Test Solutions – New 3D Virtual Booth

Advanced Semiconductor Test

Webinar

Tiny PICs with Huge Impact: Meeting the Challenges of Photonic Integrated Circuits testing for next-generation networks.

Time: June 17, 2020

Source Measurement Solution Case Study for VCSEL / LD Testing Application

Photonics Automation

New

See how MPI teamed up with Tektronix to provide highly reliable source measurement solutions targeting the VCSEL / Laser Diode (LD) testing applications.

MPI Thermal Temperature Test Solutions - New Videos

Thermal Test

Video

Check out the new released ThermalAir Series Temperature Forcing Systems presentation videos. Discover how the Thermal technology brings temperature to your test workstation.

SEMICON Taiwan 2020

Probe Card Technologies | Photonics Automation | Advanced Semiconductor Test | Thermal Test

Event

Venue: TaiNEX 1(台北南港展覽館一館), Taipei, Taiwan

September 23-25, 2020

Booth No. K2360

Your recipe of on-wafer calibration for accurate mm-wave characterisation of advanced silicon devices

Advanced Semiconductor Test

Video

This presentation discusses solutions for both metrology-grade and production-suitable calibration methods and will share some experimental results and practical recommendations.

MPI Corporation at ICMTS 2020

Advanced Semiconductor Test

Video

A short video introducing MPI’s products and expertise showing how our systems have been developed to address a wide range of challenges surrounding device characterization and measurement analysis.

MPI Corporation at INMMiC 2020

Advanced Semiconductor Test

Video

This week MPI participated at INMMiC 2020 virtual conference hosted online with IEEE. Here is the video describing MPI’s products and expertise showing how our systems have been developed to address in the field of nonlinear microwave and millimetre-wave circuits and systems.

MPI TITAN™ Probe DC to 220 GHz

Advanced Semiconductor Test

New

The pioneering TITAN™ 220 GHz probe was developed in cooperation with Anritsu as an integrated component of the breakthrough VectorStar ME7838G 220 GHz broadband system.

MPI Introduces Unique NoiseShield™ Option for 1/f (Flicker) & RTN Measurements

Advanced Semiconductor Test

New

MPI introduced a new NoiseShield™ option, which provides excellent EMI-shielding, low impedance grounding and shortest possible cable lengths to reduce parasitic capacitance and to maximize the test system roll-off frequency.

TS2000-SE Configured with the New MPI THZ-Selection

Advanced Semiconductor Test

New

MPI THZ-Selection converts TS2000-SE system into a dedicated, mmW and THz probe station, as the first one on the market.

MPI Announced TITAN™ Multi-Contact Probe for RF IC Characterization

Advanced Semiconductor Test

New

MPI Corporation introduces the TITAN™ Multi-Contact Probe, the further advances of company’s TITAN™ RF probing technology for challenges of testing modern Si RF ICs.

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