MPI Automated Probe Systems

Main Applications

MPI is proud to announce its new 200mm automated probe system, dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.

What is New?

The new Advanced Semiconductor Test engineering probe systems incorporate the same hardware controller as the well-established, market leading LED Test probe systems that has global installed base of more than 9000 systems. Time tested and proven in demanding 24/7 operations, MPI is now introducing such capabilities and systems reliability into the Engineering Market.

New Products

The TS2000 is the probe system which can be configured with ambient to hot chucks up to 300°C.

The TS2000-SE is the advanced probe system equipped with automated single wafer loader and can be configured at extended temperature ranges from -60°C to +300°C.

The SE stands for MPI ShielDEnvironment™ – a local environment chamber providing an excellent EMI- and light-tight shielding for ultra-low noise measurements.

MPI Automated Probe Systems

 TS2000  TS2000-SE  TS3000  TS3000-SE