TITAN™ Probe Technologies

MPI TITAN™ T250MS Dual Probes with PMP60_TS2000-IFE, Keysight
MPI TITAN™ T250MS Dual Probes_Probe Protector
MPI TITAN™ T250MS Dual Probes_TS2000-IFE, Keysight_closeup(Contact)
T250MS KAPPA Dual Probe with PMP60_TS2000-IFE, Keysight
MPI Dual TITAN™ Probes
MPI Low-Loss TITAN™ Probe Family for Load-Pull Applications
MPI TITAN™ mmWave Probe
MPI TITAN™ Optical Microscope Probe
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mpi titan™ t250ms dual probes with pmp60 ts2000 ife keysight
mpi titan™ t250ms dual probes probe protector
mpi titan™ t250ms dual probes ts2000 ife keysight closeupcontact
t250ms kappa dual probe with pmp60 ts2000 ife keysight
mpi dual titan™ probes
mpi low loss titan™ probe family for load pull applications
mpi titan™ mmwave probe
mpi titan™ optical microscope probe
MPI TITAN™ T250MS Dual Probes with PMP60_TS2000-IFE, Keysight
MPI TITAN™ T250MS Dual Probes_Probe Protector
MPI TITAN™ T250MS Dual Probes_TS2000-IFE, Keysight_closeup(Contact)
T250MS KAPPA Dual Probe with PMP60_TS2000-IFE, Keysight
MPI Dual TITAN™ Probes
MPI Low-Loss TITAN™ Probe Family for Load-Pull Applications
MPI TITAN™ mmWave Probe
MPI TITAN™ Optical Microscope Probe
titan t250series probes

Pushing your setup to 250 GHz but running into alignment, accuracy, or bandwidth limits?

Achieve precise, repeatable on-wafer measurements from DC to 250 GHz with TITAN™ T250MAK and T250MSK probes, engineered for next-gen device characterization with proven broadband performance. Check the specs now and see how they help you unlock the future of on-wafer measurement.

Features & Benefits

MEMS Tips

 

Precisely manufactured, the MPI TITAN™ Probes incorporate perfectly-matched 50 Ω MEMS contact tips. They ensure unmatched calibration and measurement results over a widest frequency range thanks to superior probe electrical characteristics (minimal insertion loss and crosstalk as well as high return loss).

Unique Contact Structure

 

Unlike any other tips on the market, MPI TITAN™ RF probes deliver an excellent and real time visibility of the tip contacts due to the unique protrusion tip design. For the first time, highly accurate positioning of the RF probe on calibration standards or DUT pads became possible even for unexperienced operators and without using probe alignment marks.

Contact Quality

 

MPI Corporation expands the family of the RF TITAN Probe by introducing the TITAN-RC Probe. The new probe model features the contact tip width reduced by 33% down to 20 μm. Fully aligned with the industry trend towards further reduction of the pad size for RF devices and ICs, the TITAN-RC probe significantly reduces cost of test for next generation commercial RF and mm-wave silicon devices and ICs. It enables accurate, and reproducible measurement results obtained for Si devices with Al pad metallization as small as 30 x 35 μm. TITAN-RC probes are available in GSG tips configuration with probe pitch from 50 μm to 300 μm.

Outstanding Lifetime

 

One of the strongest features of TITAN™ Probe technology is its uniform wear-out: after hundreds of thousands probe cycles, the length of the probe tip naturally shrinks. The electrical characteristics, however, remain unchanged due to the unique probe design. Thus, the life time of TITAN™ Probes outperforms the life time of comparable probe technologies.

Last but not least, TITAN™ Probes stand out thanks to a truly affordable price.

Probe Characteristics

26 GHz Probe Model: T26

40 GHz Probe Model: T40

50 GHz Probe Model: T50

67 GHz Probe Model: T67

110 GHz Probe Model: T110

145 GHz Probe Model: T145 MA

165 GHz Probe Model: T165MA

New

250 GHz Probe Model: T250MAK

26 GHz Probe Model: T26D

40 GHz Probe Model: T40S

50 GHz Probe Model: T50S

67 GHz Probe Model: T67S

120 GHz Probe Model: T120MS

145 GHz Probe Model: T145MS

165 GHz Probe Model: T165MS

220 GHz Probe Model: T220MS

New

250 GHz Probe Model: T250MSK