Seminar – Advancing Broadband/mmWave VNA Device Characterization with Connector/less Technologies

MPI TS200 with T220A probes on DUT

Advancing Broadband/mmWave VNA Device Characterization with Connector/less Technologies

The Seminar will explore the expanding role of Broadband on-wafer Vector Network Analyzer (VNA) measurements in modern microwave communication systems, particularly in the millimeter-wave up to 220 GHz. Attendees will gain insights into how advanced broadband VNA solutions, like Anritsu’s VectorStar ME7838G/4 220 GHz system and MPI probes, address these challenges by supporting single ended 2 to 4 ports as well as  differential measurement requirements.

  • 展覽日期: 2024年12月5日
  • 時間: 10:30 – 15:00 GMT
  • 展覽地點: National Physical Laboratory, Teddington, United Kingdom
  • 參與部門: Advanced Semiconductor Test 

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