VEGA 系列

實現高效能的雷射二極體量測整合方案

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VEGA Series

High performance Laser Diode probe & test solutions

LCD Driver Probe Card
PC201-1114-FFB81C
Advanced Cobra Probe Card
WAT Parametric Probe Card Low Leakage

Optimize Your Testing

Comprehensive Devices Efficient Turnkey Solutions

State of the Art Solutions for

PA201-1114-FFB81C
Fully Auto Laser Diode Prober

Advanced Wafer / DUT Automated Test, Measurement, and Inspection Technologies

for Photonics, Optoelectronics, Lasers and LED Industries

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A201-1114-FFB81C
TS2000-SE.fw
TS3000-SE.fw

Advanced Semiconductor Test

Engineering Probe Systems

RF Probes

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T201-1114-FFB81C.png

ThermalAir Series Temperature Forcing Systems

Environmental Test Chambers

Fast Temperature Cycling Test

-80°C to +225°C - Energy Efficient

LCD Driver Probe Card
PC201-1114-FFB81C

Ultra-High Performance Probe Cards

With the Lowest Cost of Ownership

Delivering Extreme Test Capabilities

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VEGA 系列點測設備概覽

MPI的VEGA系列點測設備, 專為對應光感測市場的雷射二極體(Laser Diode, 如VCSEL及EEL)元件, 及其他光電模組測試用途量身打造.

VEGA系列機種具備靈活的點測系統架構(晶圓, 封裝, 或單顆晶粒), 能提供精準的量測數據, 多種點測機制選擇結合恰到好處的針壓設計, 良好的溫度控制, 以及優越的薄/翹曲晶圓處理能力, 讓您能輕鬆地進行晶圓上雷射元件各種關鍵特性測試如LIV, 遠場(Far Field),及近場(Near Field).

產業應用
光通訊 光感測

VEGA TP點測設備系列主要特色

最大化點測環境溫度支援(-40˚ to +200˚C).
高效Loader系統可彈性對應多樣的待測元件如薄/翹曲晶圓, 一般晶圓, 基板, 封裝或其他元件.
多種收光架構可依照您的測試需求(LIV / 近場 / 遠場)選擇.
彈性的點測機制如Probe Card Holder (PCH), Wedge Probe Card, MPI F1探針模組等搭配, 可實現高度準確的量測結果.
MPI 高效能的點測設備控制軟體提供全面的控制功能 - 從基本的晶圓對齊, 圖布定位, 針痕檢測及運用進階的MPI獨特精細對針機制 (Needle Alignment Mechanism).

MPI 光電量測系統採用以使用者視角為出發點設計的介面布局, 操作直覺並能依照您的測試需求任意調整設定:

彈性編輯: 因應您的測試需求,任意進行測試參數/條件/及時序控制之設定調整.
生產控管: 即時可視化介面, 讓您隨時掌握系統狀態資訊. 透過直覺的使用介面, 輕鬆管理實驗室研究資料或工廠生產數據. 系統全面無死角監控量測任務進度, 在無人干預的情況下, 也能確保測試程序順利進行.
無縫整合: 系統可支援並控制市場大多數主流測試儀器, 我們將為您搭配最適化的儀器進行測量.

能力
高溫測試 低溫測試 彈性收光
機型
手動 半自動 全自動
待測物
VCSEL PD

VEGA FP點測設備系列主要特色

彈性的點測機制如VPC, Probe Card Holder (PCH), Wedge Probe Card, MPI F1探針模組等搭配, 可實現高度準確的量測結果.
彈性的系統架構可依照您的測試需求(LIV / 近場 / 遠場)選擇多種收光模組.

提供多種點測模式及進出料選擇:
支援上點測下收光, 或同時點測功能.

MPI 高效能的點測設備控制軟體提供全面的控制功能 - 從基本的晶圓對齊, 圖布定位, 針痕檢測及運用進階的MPI獨特精細對針機制 (Needle Alignment Mechanism).

MPI光電量測系統採用以使用者視角為出發點設計的介面布局, 操作直覺並能依照您的測試需求任意調整設定:

彈性編輯: 因應您的測試需求,任意進行測試參數/條件/及時序控制之設定調整.
生產控管: 即時可視化介面, 讓您隨時掌握系統狀態資訊. 透過直覺的使用介面, 輕鬆管理實驗室研究資料或工廠生產數據. 系統全面無死角監控量測任務進度, 在無人干預的情況下也能確保測試程序順利進行.
無縫整合: 系統可支援並控制市場大多數主流測試儀器, 我們將為您搭配最適化的儀器進行測量.

能力
高溫測試 低溫測試 彈性收光
機型
半自動 全自動
待測物
VCSEL PD

VEGA DP點測設備系列主要特色

多樣化的機種架構, 支援多種物料測試形式如VCSELs, EELs, 或封裝級元件測試.
飛快的點測及挑揀速度能大幅降低量測費用.
機台具備精準溫控能力, 不論是高低溫或負溫量測皆可輕鬆對應.
多重量測站點, 可依據測試需求隨意切換量測參數如LIV / 近場 / 遠場等.
能力
高溫測試 低溫測試 彈性收光
機型
半自動 全自動
待測物
VCSEL EEL PD

對MPI PA的產品感興趣, 想尋求更多資訊嗎?
歡迎點擊以下按鈕與我們聯繫

或直接Email至 pa-sales@mpi-corporation.com

MPI專員將會儘速回覆, 謝謝!

VEGA Top Prober (TP) Series Key Feature

MPI VEGA Prober series is ready to meet the diverse test and material handling requirements of the Laser Diode (VCSEL, EEL) and optical module markets. MPI VEGA probers are based on a highly flexible and reliable platform, enabling the test of a wide variety of device types (Wafer, Package & Singulated Die) over temperatures with the ability to handle thin/warped wafers. Multiple probing schemes are also supported with the ability to probe small pads with well-controlled needle force. High throughput tests of key device characteristics such as LIV, Far Field, and Near Field measurements are enabled by a comprehensive test and measurement suite capable of controlling a variety of measurement instruments on the market for optimal integration.
MARKETS SERVED
Optical Com Optical Sensing

VEGA Top Prober (TP) Series Key Feature

Extreme temperature test capability (-40˚ to +200˚C).
High performance loader system easily handles various device types such as thin/warped wafer, normal wafer, substrate, Packaged or other devices.
Multiple optics / detector choices to meet your exact needs to test LIV, Near Field, and Far Field optical characteristics.
Selectable contact mechanism options include: Probe Card Holder (PCH), Wedge Probe Card and MPI F1 Single Probe Module achieving high precision measurement.
MPI SIRIUS prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.

The STARGAZER Photonics Test System features a user-centric design that can be flexibly configured and programmed according to your unique test requirements.

Flexibility: With support for multiple test recipes, the user can flexibly select or modify the workflow or edit parameters according to the product and tests being performed.
Production Management: Manage lab/production data via the intuitive and easy-to-use software interface. Integrated real-time system monitoring and reporting enable a smooth and fully unattended test process.
Seamless Integration:With MPI’s extensive instrument library, the STARGAZER test system can easily interface with mainstream third-party measurement instruments to meet your unique testing needs.

CABABILITY
High Temp Low Temp Flexible Optics
CONFIGURATION
Manual Semi Auto Fully Auto
DUT
VCSEL PD

VEGA Top Prober (TP) Series Key Feature

Multiple contact mechanism options include: VPC, Probe Card Holder (PCH), Wedge Probe Card, and MPI F1 Single Probe Module.
Flexible structure for mounting multiple optics system for LIV, Near Field, and Far Field testing.

The STARGAZER Photonics Test System features a user-centric design that can be flexibly configured and programmed according to your unique test requirements.

Input/output orientations:
- Wafer top side electrical probe + bottom side optical measurement
- Simultaneous probing of wafer top/bottom surfaces

MPI SIRIUS prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.
MPI SIRIUS prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.

The STARGAZER Photonics Test System features a user-centric design that can be flexibly configured and programmed according to your unique test requirements.

Flexibility: With support for multiple test recipes, the user can flexibly select or modify the workflow or edit parameters according to the product and tests being performed.
Production Management: Manage lab/production data via the intuitive and easy-to-use software interface. Integrated real-time system monitoring and reporting enable a smooth and fully unattended test process.
Seamless Integration:With MPI’s extensive instrument library, the STARGAZER test system can easily interface with mainstream third-party measurement instruments to meet your unique testing needs.

CABABILITY
High Temp Low Temp Flexible Optics
CONFIGURATION
Manual Semi Auto Fully Auto
DUT
VCSEL PD

VEGA Top Prober (TP) Series Key Feature

A wide range of configuration options perfectly designed for testing VCSELs, EELs, Packaged devices, and more.
Extremely fast probing and sorting cycle for reduced cost-of-test.
Supports a broad range of temperatures ranging from high temperature to sub-zero testing.
Multiple test stations for mounting optical components for LIV, Near Field, and Far Field testing.
CABABILITY
High Temp Low Temp Flexible Optics
CONFIGURATION
Manual Semi Auto Fully Auto
DUT
VCSEL EEL PD

對MPI PA的產品感興趣, 想尋求更多資訊嗎?
歡迎點擊以下按鈕與我們聯繫

或直接Email至 pa-sales@mpi-corporation.com

MPI專員將會儘速回覆, 謝謝!

需要協助或有任何問題嗎?

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