AVIOR 系列

完整的高性能點測設備系列, 用於光通訊元件如雷射二極體,

光感測器, 及其他整合元件量測應用

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AVIOR 系列點測設備概覽

AVIOR系列機種為MPI專門針對光通訊元件應用所開發的產品線, 因應不同測試需求, 本系列提供頂部發光(Top Probing), 背部發光(Flip-chip Probing), 及晶粒/封裝(DP)等多種點測架構. 旺矽科技經由多年在光電量測領域所累積的深厚經驗及技術, 可同時提高產品可靠性並最小化生產成本, 提供客戶從研發到量產階段最完整而全面的支援.

產業應用
光通訊

AVIOR TP點測設備系列主要特色

靈活的架構配置可支援2”~8”晶圓點測, 並可彈性搭配對應配件如載台系統及點測機制.
高度精確的光電(DC/RF/Pulsed)測試.
彈性的點測機制如Probe Card Holder (PCH), Wedge Probe Card, 及MPI F1探針模組等搭配可供選擇.
精準的打光/視覺架構結合可彈性調整的測試程序, 可彈性對應客戶需求搭配.
MPI 高效能的點測設備控制軟體提供全面的控制功能 - 從基本的晶圓對齊, 圖布定位, 針痕檢測及運用進階的MPI獨特精細對針機制 (Needle Alignment Mechanism).

MPI光電量測系統採用以使用者視角為出發點設計的介面布局, 操作直覺並能依照您的測試需求任意調整設定:

彈性編輯: 因應您的測試需求,任意進行測試參數/條件/及時序控制之設定調整.
生產控管: 即時可視化介面, 讓您隨時掌握系統狀態資訊. 透過直覺的使用介面, 輕鬆管理實驗室研究資料或工廠生產數據. 系統全面無死角監控量測任務進度, 在無人干預的情況下也能確保測試程序順利進行.
無縫整合: 系統可支援並控制市場大多數主流測試儀器, 我們將為您搭配最適化的儀器進行測量.

能力
多種點測介面 最大支援8”晶圓
機型
半自動 全自動
待測物
VCSEL PD

AVIOR FP點測設備系列主要特色

支援多種探針點測介面如Probe Card Holder (PCH), Wedge Probe Card, 及MPI F1探針模組.
精準的打光/視覺架構結合可彈性調整的測試程序, 可彈性對應客戶需求搭配.

提供多種點測模式及進出料選擇:
支援上點測下收光, 或同時點測功能.

MPI 高效能的點測設備控制軟體提供全面的控制功能 - 從基本的晶圓對齊, 圖布定位, 針痕檢測及運用進階的MPI獨特精細對針機制 (Needle Alignment Mechanism).

MPI光電量測系統採用以使用者視角為出發點設計的介面布局, 操作直覺並能依照您的測試需求任意調整設定:

彈性編輯: 因應您的測試需求,任意進行測試參數/條件/及時序控制之設定調整.
生產控管: 即時可視化介面, 讓您隨時掌握系統狀態資訊. 透過直覺的使用介面, 輕鬆管理實驗室研究資料或工廠生產數據. 系統全面無死角監控量測任務進度, 在無人干預的情況下也能確保測試程序順利進行.
無縫整合: 系統可支援並控制市場大多數主流測試儀器, 我們將為您搭配最適化的儀器進行測量.

能力
多種點測介面 最大支援8”晶圓
機型
半自動 全自動
待測物
VCSEL PD

AVIOR DP點測設備系列主要特色

多樣化的機種架構, 支援多種物料測試形式如VCSELs, EELs, 或封裝級元件測試.
飛快的點測及挑揀速度能大幅降低量測費用.
優化的進出點測平台設計能支援多種進出料模式.
機台具備精準溫控能力, 不論是高低溫或負溫量測皆可輕鬆對應.
多重量測站點, 可依據測試需求隨意切換量測參數如LIV / 近場 / 遠場等.
能力
多種點測介面 最大支援8”晶圓
機型
全自動
待測物
VCSEL EEL PD

對MPI PA的產品感興趣, 想尋求更多資訊嗎?
歡迎點擊以下按鈕與我們聯繫

或直接Email至 pa-sales@mpi-corporation.com

MPI專員將會儘速回覆, 謝謝!

VEGA Top Prober (TP) Series Key Feature

MPI VEGA Prober series is ready to meet the diverse test and material handling requirements of the Laser Diode (VCSEL, EEL) and optical module markets. MPI VEGA probers are based on a highly flexible and reliable platform, enabling the test of a wide variety of device types (Wafer, Package & Singulated Die) over temperatures with the ability to handle thin/warped wafers. Multiple probing schemes are also supported with the ability to probe small pads with well-controlled needle force. High throughput tests of key device characteristics such as LIV, Far Field, and Near Field measurements are enabled by a comprehensive test and measurement suite capable of controlling a variety of measurement instruments on the market for optimal integration.
MARKETS SERVED
Optical Com Optical Sensing

VEGA Top Prober (TP) Series Key Feature

Extreme temperature test capability (-40˚ to +200˚C).
High performance loader system easily handles various device types such as thin/warped wafer, normal wafer, substrate, Packaged or other devices.
Multiple optics / detector choices to meet your exact needs to test LIV, Near Field, and Far Field optical characteristics.
Selectable contact mechanism options include: Probe Card Holder (PCH), Wedge Probe Card and MPI F1 Single Probe Module achieving high precision measurement.
MPI SIRIUS prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.

The STARGAZER Photonics Test System features a user-centric design that can be flexibly configured and programmed according to your unique test requirements.

Flexibility: With support for multiple test recipes, the user can flexibly select or modify the workflow or edit parameters according to the product and tests being performed.
Production Management: Manage lab/production data via the intuitive and easy-to-use software interface. Integrated real-time system monitoring and reporting enable a smooth and fully unattended test process.
Seamless Integration:With MPI’s extensive instrument library, the STARGAZER test system can easily interface with mainstream third-party measurement instruments to meet your unique testing needs.

CABABILITY
High Temp Low Temp Flexible Optics
CONFIGURATION
Manual Semi Auto Fully Auto
DUT
VCSEL PD

VEGA Top Prober (TP) Series Key Feature

Multiple contact mechanism options include: VPC, Probe Card Holder (PCH), Wedge Probe Card, and MPI F1 Single Probe Module.
Flexible structure for mounting multiple optics system for LIV, Near Field, and Far Field testing.

The STARGAZER Photonics Test System features a user-centric design that can be flexibly configured and programmed according to your unique test requirements.

Input/output orientations:
- Wafer top side electrical probe + bottom side optical measurement
- Simultaneous probing of wafer top/bottom surfaces

MPI SIRIUS prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.
MPI SIRIUS prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.

The STARGAZER Photonics Test System features a user-centric design that can be flexibly configured and programmed according to your unique test requirements.

Flexibility: With support for multiple test recipes, the user can flexibly select or modify the workflow or edit parameters according to the product and tests being performed.
Production Management: Manage lab/production data via the intuitive and easy-to-use software interface. Integrated real-time system monitoring and reporting enable a smooth and fully unattended test process.
Seamless Integration:With MPI’s extensive instrument library, the STARGAZER test system can easily interface with mainstream third-party measurement instruments to meet your unique testing needs.

CABABILITY
High Temp Low Temp Flexible Optics
CONFIGURATION
Manual Semi Auto Fully Auto
DUT
VCSEL PD

VEGA Top Prober (TP) Series Key Feature

A wide range of configuration options perfectly designed for testing VCSELs, EELs, Packaged devices, and more.
Extremely fast probing and sorting cycle for reduced cost-of-test.
Supports a broad range of temperatures ranging from high temperature to sub-zero testing.
Multiple test stations for mounting optical components for LIV, Near Field, and Far Field testing.
CABABILITY
High Temp Low Temp Flexible Optics
CONFIGURATION
Manual Semi Auto Fully Auto
DUT
VCSEL EEL PD

對MPI PA的產品感興趣, 想尋求更多資訊嗎?
歡迎點擊以下按鈕與我們聯繫

或直接Email至 pa-sales@mpi-corporation.com

MPI專員將會儘速回覆, 謝謝!

需要協助或有任何問題嗎?

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