CAPELLA 系列

從晶圓級到封裝段, 提供LED / Mini LED 一站式量測解決方案

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CAPELLA 系列點測設備概覽

MPI Photonics Automation致力於提供LED / Mini LED 一站式量測解決方案, 在全球已累積超過一萬台的裝機實例, 足見其點測設備具備可經長時間測試的高性能及高可靠性.

CAPELLA系列點測設備具備靈活的系統結構, 從晶圓段到封裝段測試, 皆可全面支援各種LED產品類型量測(水平型, 垂直型, 覆晶倒裝型). 從實驗室到生產各個環節, 不論是進階高效能, 具成本效益, 或是特殊需求的客製機種, MPI自主研發的各式點測設備皆能滿足您的需求.

產業應用
一般照明 戶外顯示 背光模組
醫療與健康 車用照明

CAPELLA TP點測設備系列主要特色

最具成本效益的精確生產量測能力.
多站點測試能力搭配high pin count探針卡針測技術(4~256 channels) 可大幅提高產能.
完整的統計報告及分析工具, 用於測量LED光電特性如color chromaticity (xyz), intensity, irradiance等.
模組化的系統架構設計能提供半自動, 全自動, 或高度整合的叢集點測設備系統, 不論是實驗室研究開發, 或是量產用途, 皆能因應客戶需求設計建置.
MPI 高效能的點測設備控制軟體提供全面的控制功能 - 從基本的晶圓對齊, 圖布定位, 針痕檢測及運用進階的MPI獨特精細對針機制 (Needle Alignment Mechanism).

MPI光電量測系統採用以使用者視角為出發點設計的介面布局, 操作直覺並能依照您的測試需求任意調整設定:

彈性編輯: 因應您的測試需求,任意進行測試參數/條件/及時序控制之設定調整.
生產控管: 即時可視化介面, 讓您隨時掌握系統狀態資訊. 透過直覺的使用介面, 輕鬆管理實驗室研究資料或工廠生產數據. 系統全面無死角監控量測任務進度, 在無人干預的情況下也能確保測試程序順利進行.
無縫整合: 系統可支援並控制市場大多數主流測試儀器, 我們將為您搭配最適化的儀器進行測量, 達成高度精準的整合測試.

能力
高成本效益 多站測試 Chromaticity
機型
半自動 全自動
待測物
LED

CAPELLA FP點測設備系列主要特色

最具成本效益的精確生產量測方案.
多站點測試能力搭配high pin count探針卡針測技術(4~256 channels) 可大幅提高產能.
完整的統計報告及分析工具, 用於測量LED光電特性如color chromaticity (xyz), intensity, irradiance等.
模組化的系統架構設計能提供半自動, 全自動, 或高度整合的叢集點測設備系統, 不論是實驗室研究開發, 或是量產用途, 皆能因應客戶需求設計建置.
MPI 高效能的點測設備控制軟體提供全面的控制功能 - 從基本的晶圓對齊, 圖布定位, 針痕檢測及運用進階的MPI獨特精細對針機制 (Needle Alignment Mechanism).

MPI光電量測系統採用以使用者視角為出發點設計的介面布局, 操作直覺並能依照您的測試需求任意調整設定:

彈性編輯: 因應您的測試需求,任意進行測試參數/條件/及時序控制之設定調整.
生產控管: 即時可視化介面, 讓您隨時掌握系統狀態資訊. 透過直覺的使用介面, 輕鬆管理實驗室研究資料或工廠生產數據. 系統全面無死角監控量測任務進度, 在無人干預的情況下也能確保測試程序順利進行.
無縫整合: 系統可支援並控制市場大多數主流測試儀器, 我們將為您搭配最適化的儀器進行測量, 達成高度精準的整合測試.

能力
高成本效益 多站測試 Chromaticity
機型
半自動 全自動
待測物
LED Mini LED

CAPELLA DP點測設備系列主要特色

用於封裝LED產品的準確量測.
絕佳的測試準確度:
- 待測產品與積分球間距極小, 可確保收光品質
- Dice off-set 補償校正功能
精準且穩定的溫度控制能力並可依據量測需求搭配對應溫度載台.
精密並可調整的取放力量(5g~200g).
全覆式暗箱板金設計可完整屏蔽外部環境干擾.
進階的晶粒瑕疵檢查手法.
能力
高溫測試 精確量測
CSP量測 高成本效益
機型
全自動
待測物
LED

對MPI PA的產品感興趣, 想尋求更多資訊嗎?
歡迎點擊以下按鈕與我們聯繫

或直接Email至 pa-sales@mpi-corporation.com

MPI專員將會儘速回覆, 謝謝!

VEGA Top Prober (TP) Series Key Feature

MPI VEGA Prober series is ready to meet the diverse test and material handling requirements of the Laser Diode (VCSEL, EEL) and optical module markets. MPI VEGA probers are based on a highly flexible and reliable platform, enabling the test of a wide variety of device types (Wafer, Package & Singulated Die) over temperatures with the ability to handle thin/warped wafers. Multiple probing schemes are also supported with the ability to probe small pads with well-controlled needle force. High throughput tests of key device characteristics such as LIV, Far Field, and Near Field measurements are enabled by a comprehensive test and measurement suite capable of controlling a variety of measurement instruments on the market for optimal integration.
MARKETS SERVED
Optical Com Optical Sensing

VEGA Top Prober (TP) Series Key Feature

Extreme temperature test capability (-40˚ to +200˚C).
High performance loader system easily handles various device types such as thin/warped wafer, normal wafer, substrate, Packaged or other devices.
Multiple optics / detector choices to meet your exact needs to test LIV, Near Field, and Far Field optical characteristics.
Selectable contact mechanism options include: Probe Card Holder (PCH), Wedge Probe Card and MPI F1 Single Probe Module achieving high precision measurement.
MPI SIRIUS prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.

The STARGAZER Photonics Test System features a user-centric design that can be flexibly configured and programmed according to your unique test requirements.

Flexibility: With support for multiple test recipes, the user can flexibly select or modify the workflow or edit parameters according to the product and tests being performed.
Production Management: Manage lab/production data via the intuitive and easy-to-use software interface. Integrated real-time system monitoring and reporting enable a smooth and fully unattended test process.
Seamless Integration:With MPI’s extensive instrument library, the STARGAZER test system can easily interface with mainstream third-party measurement instruments to meet your unique testing needs.

CABABILITY
High Temp Low Temp Flexible Optics
CONFIGURATION
Manual Semi Auto Fully Auto
DUT
VCSEL PD

VEGA Top Prober (TP) Series Key Feature

Multiple contact mechanism options include: VPC, Probe Card Holder (PCH), Wedge Probe Card, and MPI F1 Single Probe Module.
Flexible structure for mounting multiple optics system for LIV, Near Field, and Far Field testing.

The STARGAZER Photonics Test System features a user-centric design that can be flexibly configured and programmed according to your unique test requirements.

Input/output orientations:
- Wafer top side electrical probe + bottom side optical measurement
- Simultaneous probing of wafer top/bottom surfaces

MPI SIRIUS prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.
MPI SIRIUS prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.

The STARGAZER Photonics Test System features a user-centric design that can be flexibly configured and programmed according to your unique test requirements.

Flexibility: With support for multiple test recipes, the user can flexibly select or modify the workflow or edit parameters according to the product and tests being performed.
Production Management: Manage lab/production data via the intuitive and easy-to-use software interface. Integrated real-time system monitoring and reporting enable a smooth and fully unattended test process.
Seamless Integration:With MPI’s extensive instrument library, the STARGAZER test system can easily interface with mainstream third-party measurement instruments to meet your unique testing needs.

CABABILITY
High Temp Low Temp Flexible Optics
CONFIGURATION
Manual Semi Auto Fully Auto
DUT
VCSEL PD

VEGA Top Prober (TP) Series Key Feature

A wide range of configuration options perfectly designed for testing VCSELs, EELs, Packaged devices, and more.
Extremely fast probing and sorting cycle for reduced cost-of-test.
Supports a broad range of temperatures ranging from high temperature to sub-zero testing.
Multiple test stations for mounting optical components for LIV, Near Field, and Far Field testing.
CABABILITY
High Temp Low Temp Flexible Optics
CONFIGURATION
Manual Semi Auto Fully Auto
DUT
VCSEL EEL PD

對MPI PA的產品感興趣, 想尋求更多資訊嗎?
歡迎點擊以下按鈕與我們聯繫

或直接Email至 pa-sales@mpi-corporation.com

MPI專員將會儘速回覆, 謝謝!

需要協助或有任何問題嗎?

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