測試方案

旺矽於2008年開始提供光電測試的量測方案。搭配成熟的點測設備,旺矽多年來累積了充分的LED量產經驗,故我們的量測方案可以提供彈性化的生產參數管理,準確且穩定的量測與校正方法,以及有效的統計與量產分析方法。量測方案可依據客戶產品提供最佳的組成,包含各式光譜卡、PD感測器、電流源或是電性量測元件的整合。藉由對各儀器的量測的精準控制與計算分析,旺矽量測方案可廣泛的應用於各項光學元件的量測。
對於LED晶粒與封裝產品的量測,旺矽分別提供了 T200點測系統與T100點測系統,此兩系統可應用在各式LED晶粒量測。針對各式光學產品的量測方案需求,歡迎連繫旺矽,我們可以提供您最佳的光學量測方案。

EXPLORE MPI PHOTONIC APPLICATIONS

MPI offers a comprehensive portfolio of test, measurement and inspection solutions meeting the demands of the Photonics, Optoelectronics, Semiconductor, and Laser industries.

MPI Photonic solutions for Optical Communication applications (Datacom, Telecom, Laser, Photodetector, Photodiode)

OPTICAL COMMUNICATIONS

Precision test and measurement solution for optical devices such as Photo Detectors and Laser Diodes

MPI Photonic solutions for Optical Sensing applications (VCSEL, LiDAR, ToF, Time-of-Flight, 3D Sensing, Facial Recognition, Automotive sensing)

OPTICAL SENSING

Turn-key solution addressing 3D sensing consumer (Facial Recognition, Gesture Recognition, AR) and Automotive (LiDAR) applications

MPI Photonic solutions for Micro Display applications (Micro LED, Mass Transfer, VR, AR)

MICRO DISPLAY

Accurate probing tool combined with idea mass transfer method

MPI Photonic solutions for LED applications (Automotive / General Lighting)

LED

Complete solution covers testing, sorting, and inspection from wafer to package die level

MPI Photonic solutions for Optical Sensing applications (VCSEL, LiDAR, ToF, Time-of-Flight, 3D Sensing, Facial Recognition, Automotive sensing)

SILICON PHOTONICS

Dedicated SiPH on-wafer tests designed to perform repeatable low noise measurements

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