SWTest 2026

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SWTest 2026

The Semiconductor Wafer Test Conference (SWTest) is celebrating over 30 years as the only industry event that focuses on all the aspects associated with microelectronic wafer and die level testing. The conference has the perfect mixture of manufacturer and vendor presentations. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas.

  • 展覽日期: 2026年6月8 – 10日
  • 展覽地點: 美國拉卡斯塔溫泉度假飯店
  • 攤位號碼: 306/304
  • 參與部門: Probe Card | Celadon

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