SWTest 2025

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SWTest 2025

The Semiconductor Wafer Test Conference (SWTest) is celebrating over 30 years as the only industry event that focuses on all the aspects associated with microelectronic wafer and die level testing. The conference has the perfect mixture of manufacturer and vendor presentations. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas.

  • 展覽日期: 2025年6月2 – 4日
  • 展覽地點: Omni La Costa, Carlsbad, SD, CA, USA
  • 攤位號碼: 412/414
  • 參與部門: Probe Card | Celadon

 

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