IS-Test – Workshop – ITWS

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IS-Test – Workshop – ITWS

ITWS – the European IS-Test Workshop – is one of the most important get-together events for the semiconductor industry in Europe. With a regular number between 60-100 participants, the workshop is a technical conference with a focus on wafer probing, probe cards, and probing technologies to address challenges of the industry and “solve common problems together”.

  • 日期: 2025年9月15 – 16日
  • 地點: 德國慕尼黑機場萬豪酒店
  • 參與部門: Probe Card 

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