Automotive Testing Expo 2018

  • Exhibition on: October 23-25, 2018
  • Hall B, The Suburban Collection Showplace, Novi, MI, USA
  • Please visit us at Booth No. 8034
  • 參加部門: Thermal Test

Laser Taiwan 2018

  • Exhibition on: October 17-19, 2018
  • Hall 1, TWTC Nangang Exhibition Center, Taipei, Taiwan
  • Please visit MPI in VCSEL 3D Sensing Pavilion
  • 參加部門: Photonics Automation

European Microwave Week 2018

  • Exhibition on September 25-27, 2018
  • Ifema Feria de Madrid, Madrid, Spain
  • Please visit us at Booth No. 22
  • 參加部門: Advanced Semiconductor Test

China International Optoelectronic Expo (CIOE)

  • Exhibition on: September 5-8, 2018
  • Shenzhen Convention & Exhibition Center, Shenzhen, China
  • Please visit us at Booth No. 2538、2539 (Hall 2)
  • 參加部門: Thermal Test



  • September 3, 2018
  • Please come join the Luncheon at Zeltschlösschen (Nürnberger Straße 55, Dresden), Germany
  • 參加部門: Advance Semiconductor Test
The Luncheon is sponsored by Rohde & Schwarz. Please register for this event while registering for the Conference.

[Subject]:Pioneering Solutions for Wafer-Level Device, IC and System Characterization in the mmWave Range and Beyond
[Presenter]:Andreas Henkel, Product Manager Vector Network Analysis, Rohde & Schwarz GmbH & Co. KG
Andrej Rumiantsev, Director RF Technologies, MPI Corporation
[Abstract]:The automotive radar, self-driving cars and 5G applications are the key driving forces to extend semiconductor technologies to higher frequencies and bandwidths. Even in the mobile communications, frequency ranges up to 70 GHz to 80 GHz and beyond are considered for handheld devices or backhaul systems. However, challenges of obtaining accurate measurement results increase exponentially with the frequency range: active devices require precisely calibrated stimuli for magnitude, phase and power at the device level, e.g. to perform calibrated compression point measurements. Moreover, the majority of characterization tasks should be executed at the wafer-level. This drastically increases the complexity of the integrated measurement systems.

The workshop will start with an overview of specific requirements for measurement and calibration techniques. Later, we will introduce pioneering solutions for mm-wave device characterization, ICs and system measurements at the wafer-level: e.g. for on-chip antenna characterization as well as for THz measurements. Based on experience and expertise of R&S and MPI, complex and fully-integrated solutions were developed to help engineers obtaining most accurate and reliable results with highest confidence and in shortest time.

Attendees will also have an unique opportunity for a Q&A session with technology experts in informal way during the event.
[Time]:12:30 pm - 2:00 pm, Monday, September 3, 2018


  • September 2 – 6, 2018
  • The International Conference Centre, Birmingham, UK
  • Please visit our booth at C6, L4 (Hall 3)
  • 參加部門: Advanced Semiconductor Test

International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

  • Exhibition on: July 17-19, 2018
  • Marina Bay Sand Expo and Convention Centre, Singapore
  • Please visit us at Booth No. 21
  • 參加部門: Advanced Semiconductor Test

Semicon West 2018

  • Exhibition on July 10-12, 2018
  • Moscone Center, San Francisco, CA, USA
  • Please visit us at Booth No. 6169 in North Hall
  • 參加部門: Probe Card Technologies | Thermal Test

UK Semiconductors 2018

91st ARFTG Microwave Measurement Symposium

IEEE MTT-S International Microwave Symposium 2018

IEEE Semiconductor Wafer Test Workshop 2018

  • Exhibition on June 3-6, 2018
  • Rancho Bernado Inn, San Diego, CA, USA
  • Please visit us at Booth No. 9
  • 參加部門: Probe Card Technologies
[Presentation]: Vertical MEMS Probe Card Applied to High Speed Loopback Test of Network Communication IC
[Presenter]: Adolph Cheng
[Date]: Monday, June 05, 2018


The 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

  • Exhibition on May 14 – 17,  2018
  • Palmer House Hilton Hotel, Chicago, IL, USA
  • Please visit us at Booth No. 6 on Level 3
  • 參加部門: Advanced Semiconductor Test

31st IEEE International Conference on Microelectronic Test Structures (ICMTS)

  • Exhibition on March 20-22, 2018
  • Courtyard Marriott Austin Convention Center, Austin, TX, USA
  • Please visit us in the room Brazos
  • Participating Division: Advanced Semiconductor Test


MPI at Productronica with Semicon Europa 2017 – Event Highlights

Munich, Germany, Nov. 17th, 2017 – MPI Corporation, the global technology leader in test and measurement markets for various applications, attended this year’s Semicon Europa. Strategically staged alongside Productronica, this year’s Semicon Europa has become the largest and most advanced Microelectronics event in Europe.

IMG_8389“Semicon Europa is the largest platform for exchanging the latest ideas on semiconductor manufacturing in Europe and has drawn tens of thousands of attendances worldwide. MPI’s presence at the show enabled precision engagement with the market on the latest product innovations.” Says Meiling Wu, Corporate Marcom, MPI Corporation. “Products were very well received during the event proving the MPI now has the world’s leading and most economically viable solutions. This high degree of success would not have been possible without the excellent partnership and support from both HTT Group ( and ATV Systems ( Working together with both of these World Class organizations, it is easy to see a long and prosperous future.”

At Semicon Europa, MPI demonstrated its technological IMG_7229strength by sharing first-hand product developments, including the advanced cantilever/vertical probe card technologies, unparalleled characterization and modeling offerings, ultra-low noise probe systems, ThermalAir stream systems, LED, Micro LED, Optical and Communications wafer probers perfectly suited for many engineering and production applications.
About MPI Corporation

Founded in 1995 and headquartered in Hsinchu, Taiwan, MPI Corporation is a global technology leader in Semiconductor, Light Emitting Diode (LED), Photo Detectors, Lasers, Materials Research, Aerospace, Automotive, Fiber Optic, Electronic Components and more. MPI’s four main business sectors include Probe Card, Photonics Automation, Advanced Semiconductor Test and Thermal Divisions. MPI products range from various advanced probe card technologies, probers, testers, material handlers, inspection and thermal air systems. Many of these products are accompanied by state-of-the-art Calibration and Test & Measurement software suites. The diversification of product portfolio and industries allows a healthy environment for employee growth and retention. Cross- pollination of product technologies allows each new innovation to provide differentiation in areas that are meaningful to our precious customer base.

For more information please visit:

Press Contact:

Lila Lee
Marketing Communications
Photonics Automation Division
MPI Corporation

OFC 2018

R&S Technology Week 2017 in Taiwan (Hsinchu Session)

  • November 16, 2017
  • Ambassador Hotel Hsinchu, Taiwan (新竹國賓飯店)
  • Please visit our booth on 10F
  • 參加部門: Advanced Semiconductor Test

This event is held by Rohde & Schwarz Taiwan. → Register Now