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Cantilever Probe Cards | LCD Driver IC  |  Logic Probe Card |  Vertical Driver Probe Card |  LCD Driver Probe Card |  Vertical Driver Probe Card | LCD Driver IC

 

Cantilever Probe Card          FCB Probe Card          EVS Probe Card         Osprey Probe Card         Grey Owl Probe Card                       

Cantilever Probe Card

LCD Driver Probe Card | Logic Probe Card | Probe Card | Parametric Probe Card | CMOS Image Sensor (CIS) Probe Card

MPI Cantilever Probe Card is widely applied on gold bump and pad wafer testing for display driver, logic, and memory device. MPI’s cantilever probes are the corresponding answer to the demands of fi­ne pitch, small pad size, high speed, less cleaning, multi-DUT, high pin count, and ultra-low leakage requirements. With outstanding craftsmanship, innovative architecture and proven methodologies based on mechanical and electrical simulation/measurement results, making MPI the top cantilever provider worldwide.

Cantilever Key Features

  • Perform multi-DUT configurations with diagonal or shelf applications for extraordinary alignment and planarity
  • Lessen thermal deformation during high or low temperature tests
  • High speed solution by R+ and U+ structure for stringent PI and SI applications
  • Stable and low contact resistance performance via advanced probe materials and design
  • Short lead time ideal for engineering device
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