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MPI Introduces Unique NoiseShield™ Option for 1/f (Flicker) & RTN Measurements
Advanced Semiconductor Test
New
MPI introduced a new NoiseShield™ option, which provides excellent EMI-shielding, low impedance grounding and shortest possible cable lengths to reduce parasitic capacitance and to maximize the test system roll-off frequency.
TS2000-SE Configured with the New MPI THZ-Selection
Advanced Semiconductor Test
New
MPI THZ-Selection converts TS2000-SE system into a dedicated, mmW and THz probe station, as the first one on the market.
The New MPI ITS25-THZ IMPACT™ Test Solution
Advanced Semiconductor Test
New
Enabling cost effective mmW and THZ testing with the highest possible measurement accuracy.
Factsheet now available.
Thermal Accessories that Meet Your Temperature Test Need
Thermal Test
New
MPI Thermal provides full array of intuitive functioning accessories for the ThermalAir users to flexibly and accurately test their components or device at the thermal test workstation.
MPI Thermal New ThermalAir TC-100 Gas Chiller
Thermal Test
New
Discover the evolutionary ThermalAir TC-100 Gas Chiller which focuses on localized temperature inducing of continuous -80°C Clean Dry Air.
Datasheet now available.
Enhanced Vertical Solution 80
Probe Cards
New
Probe your device with MPI’s Enhanced Vertical Solution 80 to enjoy the benefit of stable performance. Contact us for detailed information on how we can probe more efficiently and effectively.
MPI Announced TITAN™ Multi-Contact Probe for RF IC Characterization
Advanced Semiconductor Test
New
MPI Corporation introduces the TITAN™ Multi-Contact Probe, the further advances of company’s TITAN™ RF probing technology for challenges of testing modern Si RF ICs.
TITAN™ Multi-Contact Probe Online Design Capture Form
Advanced Semiconductor Test
New
Request for quote now! – Use Online Design Capture Form to build your probe by choosing RF signal (S), logic (L) and power supply (P) channels according to your IC pad layout.
