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Parametric (WAT) Probe Card

MPI Parametric (WAT) Probe Card具備優異的性能，可滿足客戶下列的測試需求：

  • Ultra-Low Leakage
  • Low Capacitance
  • Small Pad Size
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LCD Driver Probe Card

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Cantilever Probe Card
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> Logic IC
> Parametric Test
> CMOS Image Sensor
> R+ & U+
Advanced Probe Card
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