Wafer Probe Card |  Probe Card  |  Probe Card |  Probe Card |  Vertical Probe Card |  Vertical Driver Probe Card |  Vertical Probe Card 

LCD Driver Probe Card

MPI LCD Driver Probe Card具備優異的性能,可滿足客戶下列的測試需求:

  • High Speed
  • Fine Pitch
  • Small Bump/Pad Size
  • Multi-Rows Staggered Bump/Pad Layout
  • Multi-DUT
  • High Pin Count
  • Less Cleaning
  • High and Low Temperature Testing

LCD Driver Probe Card

error:

We're Sorry

This page has been moved or is no longer available.

Please Click the Button Below to Review our Current Product Line.