LCD Driver Probe Card | Probe Card | LCD Driver Probe Card | Vertical Driver Probe Card | Vertical Probe Card | Logic Probe Card | LCD Driver IC
R+ & U+ Solution for High Speed Test
旺矽自行開發專有的R+和U+高速技術，兩者同時被廣泛應用在邏輯IC，記憶體IC和LCD驅動IC上。R +和U+這兩種高速技術穩定的被使用在工程或是量產上，且高速技術涵蓋的範圍已具有專利的保護
HSPC 特點:
- Impedance matching probe structure
- Available for the speed up to Gbps level