
- Aug 4-6, 2020
- Participating Divisions: Advanced Semiconductor Test | Thermal Test
Please note: Only registered attendees will be able to access the virtual event, on demand content and exhibition. ⇒ Register Now
Registration for attendee registration will close on September 25
[Subject]: Addressing Calibration and Measurement Challenges of Broadband On-wafer VNA Measurements up to 220 GHz
[Presenter]: Steve Reyes & Dr. Jon Martens, Anritsu Company, Dr. Andrej Rumiantsev, MPI Corporation