- Exhibition: October 8, 2017
- Nürnberg Convention Center, Germany
- Please come join the workshop in Room Neu Delhi on Level 3, NCC Ost.
- 參加部門: Advanced Semiconductor Test
WS-14: Modelling, Identification and Suppression of Parasitic Modes in On-Wafer Measurements → Register Now
| Subject: | Minimising Sources of Errors in Wafer-Level Measurements at Sub-mm Wave Frequencies: What we’ve learned so far |
| Presenter: | Dr. Andrej Rumiantsev |
| Time: | 9:00 - 9:30, Sunday, October 8 |