• November 6-9, 2018
  • Kyoto International Conference Center (ICC Kyoto), Japan
  • Please visit our booth in Conference Room A and workshop in Room J, 2nd Floor
  • 參加部門: Advanced Semiconductor Test
Please add this workshop to your calendar.  Register Now


[Subject]: (WS-J) Trends of State-of-the-Art Measurement Technology – 06
Seven Reasons Why You Should Choose Multiline TRL for Wafer-Level System Calibration at mm-Wave Frequencies
[Presenter]: Dr. Andrej Rumiantsev, MPI Corporation
[Time]: 14:20 – 15:00, Tuesday, November 6