- November 6-9, 2018
- Kyoto International Conference Center (ICC Kyoto), Japan
- Please visit our booth in Conference Room A and workshop in Room J, 2nd Floor
- 參加部門: Advanced Semiconductor Test
Please add this workshop to your calendar. → Register Now
| [Subject]: | (WS-J) Trends of State-of-the-Art Measurement Technology – 06 Seven Reasons Why You Should Choose Multiline TRL for Wafer-Level System Calibration at mm-Wave Frequencies |
| [Presenter]: | Dr. Andrej Rumiantsev, MPI Corporation |
| [Time]: | 14:20 – 15:00, Tuesday, November 6 |