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Low Leakage (WAT)

旺矽擁有強大的研發團隊持續不斷地進行研究與開發,無論是在工程或量產階段的測試,更甚鑽研於晶圓的參數量測分析上。旺矽的WAT探針卡具有高性能電特性,可以在同一時間處理超低漏電流和低電容性的量測。

Low Leakage 特點:

  • Ultra low leakage
  • Cost-effective
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