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Logic IC

旺矽探針卡常用於狹間距、萬字型和多晶粒的邏輯IC測試。這些探針卡利用多晶片平行測試的方式用於數位、類比、混合信號等測試,來降低測試成本。

Logic IC 特點:

  • Multi-DUT
  • Shelf probe card
  • 2X2DUT
  • Fine pitch
  • 4 rows staggered pad
  • Small pad size
  • High speed
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