Taiwan, November 30th, 2015 – The world-leading Probe Card and Advanced Semiconductor Test Solutions provider, MPI Corporation, announced their commitment to support the National Chip Implementation Center (CIC), the leading laboratory and incubator under National Applied Research Laboratories (NARL) for IC/System design, research, and service in Taiwan. The commitment includes the donation of a 200 mm Manual Engineering Probe System – the TS200 – for a variety of applications such as Device Characterization and Modeling, Wafer Level Reliability, Failure Analysis, IC Engineering and MEMS. On behalf of MPI Corporation, Scott Kuo, the President of MPI, donated the probe system to CIC at the donation ceremony which took place in CIC. Liang-Hung Lu, the Director General of CIC, was on hand to accept the donation and reciprocated the Certificate of Appreciation to MPI.

MPI Corporation was founded in 1995 and has enjoyed undisputed worldwide recognition for probe card technology among foundries and testing houses due to an infusion between customer centricity, the latest technology development, advanced manufacturing techniques and world class customer support. The donated MPI TS200 not only supports on-wafer measurements up to 8”, the system also includes MPI’s  high magnification microscope which enables CIC engineers to precisely observe the Device Under Test (DUT) in a timely and efficient fashion. In the meantime, the unique air-bearing stage design with single-handed puck control provides unsurpassed speed in XY-axis positioning and wafer loading. Along with many other unique features, the flexibilities of the TS200 help CIC provide quality measurements to fulfill a wide range of customer requirements and enhance its chip fabrication and measurement services.

During the donation ceremony, MPI President, Scott Kuo, expressed appreciation for the dedication ceremony and looked forward to future collaboration and experience sharing, with both academia and the semiconductor industry, towards measurement interface perfection. Tzi-Dar Chiueh, the Vice President of NARL, encouraged the cooperation and also looked forward to CIC serving more academia talents with the MPI TS200 and cultivating top technologies for the Taiwan IC design industry.

Other ceremony participants include: Yung-Chin Liu, Vice President of MPI; Stojan Kanev, General Manager of MPI Advanced Semiconductor Test Division; Keng-Sheng Chang, Sales Manager of MPI Advanced Semiconductor Test Division; Steven Chan, President of Chain-Logic International Corporation (an MPI affiliate); Jiann-Jenn Wang and Hsie-Chia Chang, Deputy Director General of CIC; Da-Chiang Chang, Director of CIC Chip Implementation Service Division, and many other CIC managers.

200 mm Manual Engineering Probe System
Scott Kuo(left), the President of MPI Corporation, presented the 200 mm Manual Engineering Probe System donation to Liang-Hung Lu(right), the Director General of CIC

Reciprocated with the Certificate of Appreciation
Liang-Hung Lu(right), the Director General of CIC reciprocated with the Certificate of Appreciation to Scott Kuo(left), the President of MPI Corporation

MPI Advanced Semiconductor Test Division & CIC
Pictured from left:Keng-Sheng Chang, Sales Manager of MPI Advanced Semiconductor Test Division; Yung-Chin Liu, Vice President of MPI; Steven Chan, President of Chain-Logic International Corporation; , Stojan Kanev, General Manager of MPI Advanced Semiconductor Test Division; Scott Kuo, President of MPI; Tzi-Dar Chiueh, the Vice President of NARL; Liang-Hung Lu, the Director General of CIC; Jiann-Jenn Wang and Hsie-Chia Chang, Deputy Director General of CIC; Da-Chiang Chang, Director of CIC Chip Implementation Service Division

MPI Corporation visited CIC RF and MEMS Testing Laboratories
MPI Corporation visited CIC RF and MEMS Testing Laboratories

*Photographs courtesy of CIC
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