News Archives - MPI Corporation

ProPlus and MPI Corporation Establish Strategic Partnership, Announce Availability of a Characterization and Modeling Solution

Cross-Licensing Agreement Brings Next-Level Wafer-Level Noise Characterization,
Enabling High Throughput Measurements with Advanced Probing Technologies 

Taiwan, Dec. 12th, 2017 – ProPlus Design Solutions Inc. and MPI Corporation today announced a strategic partnership agreement and immediate availability of a characterization and modeling solution that integrates ProPlus’ SPICE modeling and noise characterization solution with MPI’s advanced probing technologies. The integrated solution offers seamless support of the MPI probe stations to perform automated measurement of DC, CV and noise characteristics, enabling MPI users easy access to the most accurate ProPlus SPICE modeling and noise characterization offerings. The advanced probing technologies developed by MPI are optimized for the latest ProPlus 9812DX noise analyzer with improved grounding and shielding technologies critical to wafer-level noise characterization.

Under the partnership agreement, ProPlus users are able to integrate MPI’s advanced semi-automatic probe stations in their characterization and modeling flow for better noise measurement quality. The close collaboration also proved that probe card wafer-level noise characterization is possible using the 9812DX noise analyzer. Previously, these measurements were performed using manipulators and easily introducing RF interferences and oscillations. The advanced probe card technology specially developed for noise measurement provides better data quality and stability, as well as improves flexibility of wafer-level noise characterization for higher throughput.

“ProPlus Design Solutions continues to invest on improving the technologies that made wafer-level noise characterization possible 20 years ago,” remarks Dr. Zhihong Liu, chairman and chief executive officer of ProPlus Design Solutions. “We brought it to the next level with a specially designed probe card for a tightly integrated noise system thus delivering the fastest and most accurate noise characterization of the highest quality. We’re pleased to work with MPI on this effort.”

“The collaboration with ProPlus Design Solutions has enabled a seamlessly integrated wafer level low-frequency noise measurement capability with guaranteed system configuration and performance,” says Dr. Stojan Kanev, general manager of Advanced Semiconductor Test Division at MPI Corporation. “We now offer the most advanced high throughput noise characterization and modeling system. MPI’s exceptional shielding technology provides world class 1/f noise measurement capability. Customers may now rest assured these systems are validated to provide reliable and accurate noise measurement capability while enjoying a reduced cost of test.”

Availability and Pricing
The integrated solution has been adopted by leading semiconductor companies. ProPlus and MPI Corporation will demonstrate the joint solution globally throughout 2018. Interested users can request a demo at either ProPlus lab in San Jose, Calif., or the MPI lab in Taiwan. Pricing is available upon request.

About MPI Corporation
Founded in 1995 and headquartered in Hsinchu, Taiwan, MPI Corporation is a global technology leader in Semiconductor, Light Emitting Diode (LED), Photo Detectors, Lasers, Materials Research, Aerospace, Automotive, Fiber Optic, Electronic Components and more. MPI’s four main business sectors include Probe Card, Photonics Automation, Advanced Semiconductor Test and Thermal Divisions. MPI products range from various advanced probe card technologies, probers, testers, material handlers, inspection and thermal air systems. Many of these products are accompanied by state-of-the-art Calibration and Test & Measurement software suites. The diversification of product portfolio and industries allows a healthy environment for employee growth and retention. Cross pollination of product technologies allows each new innovation to provide differentiation in areas that are meaningful to our precious customer base.

For more information please visit: mpi-corporation.com

About ProPlus Design Solutions
ProPlus Design Solutions, Inc. delivers Electronic Design Automation (EDA) solutions with the mission to enhance the link between design and manufacturing. As the leading provider of nano-scale SPICE modeling, the innovative giga-scale SPICE simulation and design for yield (DFY) applications, it provides the industry’s golden SPICE modeling platform, the first and only GigaSpice simulator, and the only integrated DFY design platform. Founded in 2006, ProPlus Design Solutions has R&D centers in the San Jose, Calif., Beijing and Jinan, China, and offices in Tokyo, Japan, Hsinchu, Taiwan, and Shanghai, China.

For more information, contact:
Nanette Collins
Public Relations for ProPlus Design Solutions
(617) 437-1822
nanette@nvc.com

December 12th, 2017|AST-NEWS|

MPI Corporation Introduces New 300 mm PRIME™ Thermal Chuck Technology

Taiwan, Nov. 14th, 2017 – MPI Corporation has introduced a new 300 mm thermal chuck designated PRIME™ technology for wafer probe stations with full temperature range thermal testing while delivering unsurpassed performance and flexibility.

Continuing the innovative leadership within the engineering probe system market, MPI Corporation has co-developed with ERS Electronic GmbH, the leader of wafer thermal solutions, a new 300 mm thermal PRIME™ technology. Capability enhancements include the fastest transition time in the industry, unmatched electrical performance, higher application flexibility, wider thermal range and easy field upgradability. Incorporated with the Dynamic Thermal Shield (DTS) from ERS, soak times are shortened by a factor of 60%. Within the complete test cycle of -60°C to +300°C, the PRIME™ technology chucks are ready for the test. Furthermore, the DTS continuous dew point controlled environment reduces tedious maintenance requirements.

The PRIME™ technology platform not only enhances performance, but includes a multi-application modular design concept for the ultimate in flexibility. Options include a dedicated top surface for RF & mmW, singular IC probing, inert-gas atmospheric testing for Wafer Level Reliability, High Power  with 3 kV isolation,

30 µT residual ferromagnetism, and ultra-low-noise down to fA range with more application specific configurations to be released in the coming months. In parallel, the 300 mm (12”) wafer probe station can be configured  with temperature starting points of  -60°C,  -40°C, -10°C,  +20°C  or  +30°C  and at end points  of +200°C or +300°C. All of this is easily configurable to specific test requirements and budgets.

“Unsurpassed flexibility in temperature range for applications from RF, mmW, ultra-low noise, 1/f, to high power applications and combine with unique field upgrade paths, the PRIME™ technology is the most advanced thermal chuck systems on the market today. PRIME™ technology enables the users to become more effective and efficient in thermal wafer probing applications.” Says Stojan Kanev, General Manager of MPI Corporation’s Advanced Semiconductor Division. “Adjusting to the current budgets, reducing cost of test, footprint size, significant CDA consumption and soak times for the entire system is the power behind the latest customer oriented solution.”

“We have managed to leverage the core competencies of both companies, and the result is our PRIME™ technology. We believe that PRIME™ will meet the demand of the fast-growing market for high voltage and high-frequency chips” says Klemens Reitinger, CEO of ERS electronic GmbH. “Our partnership with MPI has been extremely valuable in terms of gaining better understanding of the analytical probing market and its customers’ challenges. Being able to identify the future needs of growth markets such as the IoT, electro mobility and sensors is essential to ERS, and we believe that our new PRIME™ chucks will enhance challenging IC characterization and overall enable faster development time.”

About MPI Corporation

Founded in 1995 and headquartered in Hsinchu, Taiwan, MPI Corporation is a global technology leader in Semiconductor, Light Emitting Diode (LED), Photo Detectors, Lasers, Materials Research, Aerospace, Automotive, Fiber Optic, Electronic Components and more. MPI’s four main business sectors include Probe Card, Photonics Automation, Advanced Semiconductor Test and Thermal Divisions. MPI products range from various advanced probe card technologies, probers, testers, material handlers, inspection and thermal air systems. Many of these products are accompanied by state-of-the-art Calibration and Test & Measurement software suites. The diversification of product portfolio and industries allows a healthy environment for employee growth and retention. Cross pollination of product technologies allows each new innovation to provide differentiation in areas that are meaningful to our precious customer base.

For more information please visit: mpi-corporation.com

November 14th, 2017|AST-NEWS|

MPI Corporation Announced Successful Installation of the Next-Generation THZ Probe System at the Kollberg Laboratory of Chalmers University of Technology

Boosting Capabilities of Measurement Solutions for THz Frequencies with Unsurpassed
Measurement Dynamic Range, Calibration and Measurement Reproducibility

Taiwan, Oct. 6th, 2017 – MPI Corporation announced successful installation of the next-generation THZ probe system to the Kollberg Laboratory at Chalmers University of Technology, a leading research university located in Gothenburg, Sweden, to develop new measurement solutions for wafer-level characterization at THz frequency range.

The Kollberg laboratory, an already established infrastructure for terahertz characterization, now has superior capabilities for wafer-level electrical measurements, research on new materials, devices and circuits for sub-millimetre-wave frequency applications thanks to unique features of the new TS150-THZ probe system.

The integrated wafer probe system TS150-THZ from MPI Corporation was specifically designed for probing at THz frequencies incorporating many unique and innovative features to include seamless integration of vector network analyzer (VNA) frequency extenders of any type and frequency bands up to 1.7 THz. TS150-THZ provides the maximum possible measurement dynamic range and highest accuracy of measurement results. With the new and unique features, such as Probe Hover Control, Chuck Auto-Lock and Auto-Contact the new system significantly increases reproducibility of system calibration and measurement data and extends the lifetime of expensive THz accessories.

“As the renowned innovation leader in the field of wafer-level measurements, we are proud to deliver such a unique system to the world-class Chalmers’ THz researchers,” said Dr. Andrej Rumiantsev, Director of RF Technologies of AST Division at MPI. “As the application technology reached THz frequency, we will continue pushing wafer-level measurement limits with Chalmers’ researchers.”

Additional information is available at www.mpi-corporation.com/thz/

About Chalmers University of Technology
Chalmers University of Technology conducts research and offers education in technology, science, shipping and architecture in pursuit of its global vision for a sustainable future. Chalmers is well known for providing an effective environment for innovation and has eight priority areas of international significance: Building futures; energy; information and communication technology; life science engineering; materials science; nanoscience and nanotechnology; production; and transport.

Additional information is available at www.chalmers.se/en.

About MPI Corporation
Founded in 1995 and headquartered in Hsinchu, Taiwan, MPI Corporation is a global technology leader in Semiconductor, Light Emitting Diode (LED), Photo Detectors, Lasers, Materials Research, Aerospace, Automotive, Fiber Optic, Electronic Components and more. MPI’s four main business sectors include Probe Card, Photonics Automation, Advanced Semiconductor Test and Thermal Divisions. MPI products range from various advanced probe card technologies, probers, testers, material handlers, inspection and thermal air systems. Many of these products are accompanied by state-of-the-art Calibration and Test & Measurement software suites. The diversification of product portfolio and industries allows a healthy environment for employee growth and retention. Cross pollination of product technologies allows each new innovation to provide differentiation in areas that are meaningful to our precious customer base.

For more information please visit: www.mpi-corporation.com/ast/

Back to News
October 6th, 2017|AST-NEWS|

MPI Automated Systems Certified for IEC61010 and SEMI S2 Standards

Taiwan, August 17th, 2016 – MPI is proud to announce the successful completion of third-party conformity assessments (testing and certification) based on IEC 61010, EN ISO 12100 and SEMI S2 for all Advanced Semiconductor Tests (AST) automated probe systems. MPI has demonstrated clear leadership in recent years developing numerous and very significant innovations while serving customers within the engineering probe systems market. MPI continues its leadership position with efforts to increase transparency associated with compliance to industry specifications and standards. MPI’s receipt of the third-party certification for all of the automated probe stations reflects a commitment to increasingly important standards for end users and corporations requiring vendors to comply with industry specifications.

“The third-party certification of all AST automated probe systems is another very important part of innovation to ensure products are both safe and compliant with specific customer requirements.” says Dr. Stojan Kanev, General Manager of AST Division. “The major driver for MPI to provide third party certified products is to give the end-user a level of comfort in their purchase decisions, knowing that an independent organization has certified tools for stringent measurement applications such as the emerging high power device characterization market.”

Knowing this is critical to the development of safe products, MPI invests significant time and resources working with external organizations like TÜV and PCM. The independent organizations have reviewed the manufacturing process of the product and independently determined that the final products comply with specific standards for safety, quality or performance. This review typically includes comprehensive formulation/material reviews, testing and facility inspections.

About MPI Corporation
Founded in 1995 and headquartered in Hsinchu, Taiwan, MPI Corporation is a global technology leader in Semiconductor, Light Emitting Diode (LED), Photo Detectors, Lasers, Materials Research, Aerospace, Automotive, Fiber Optic, Electronic Components and more. MPI’s four main business sectors include Probe Card, Photonics Automation, Advanced Semiconductor Test and Thermal Divisions. MPI products range from various advanced probe card technologies, probers, testers, material handlers, inspection and thermal air systems. Many of these products are accompanied by state-of-the-art Calibration and Test & Measurement software suites. The diversification of product portfolio and industries allows a healthy environment for employee growth and retention. Cross pollination of product technologies allows each new innovation to provide differentiation in areas that are meaningful to our precious customer base.

For more information please visit: www.mpi.com.tw

Back to News
August 17th, 2016|AST-NEWS|

MPI Corporation Announces Industry Acceptance of TS150-THZ Probe System

Taiwan, May 20th, 2016 – As a result of numerous orders corresponding with the growth of terahertz frequency range measurements in the wafer test market, MPI Corporation has received industry wide acceptance of the TS150-THZ probe station as the standard for these complicated high frequency measurements. The TS150-THZ addresses the challenging test requirements of multiple emerging markets and applications, such as automotive radar, non-invasive imaging, defense, security and surveillance as well as short-range radar and high-speed 5G communication. Decades of experience in RF measurement techniques from the management team of MPI’s Advanced Semiconductor Test (AST) Division also leverages other AST products such as RF Probes, RF probing accessories and RF calibration software QAlibria® for TS150-THZ development.

The TS150-THZ was designed from ground up specifically for THz probing incorporating many unique and innovative features to include seamless integration of vector network analyzer (VNA) frequency extenders of any type and frequency band to provide the maximum possible measurement dynamic range and reproducibility of measurement results. Together with its rigid probe platen, it inherited common features of MPI manual systems, such as an air bearing stage, and a highly repeatable platen lift with three discrete positions.

“With the TS150-THZ, we are addressing a significant need for accurate and confident data obtained in the university and R&D laboratories under very challenging measurement conditions”, says Dr. Andrej Rumiantsev, Director of RF Technologies of AST Division. “Measurements at sub-THz frequency range are associated with repeated and tedious system reconfiguration to switch between VNA frequency bands and system calibration. Also, the probe system may be operated by several users sharing various level of expertise. The pioneering option of the MP80-DX positioner with an integrated digital micrometer enabled outstanding simplicity and boosted the accuracy and repeatability of the multiline TRL system calibration for unexperienced operators in a much shorter time. Another unique feature is the integration of QAlibria® with StatistiCAL® Plus, the software package from NIST. It completes the loop of precise system calibration and metrology-level analysis of measured data”.

A dove-tail interface of dedicated frequency extender adaptations makes switching between different bands as easier than ever. Positioner platforms support both coaxial and waveguide extenders. Modular chucks are available in thermal and non-thermal configurations with auxiliary chucks and with the special surface optimized for any type of the device design. These options allow for fast and easy setups in a very complicated application and make the TS150-THZ far superior to older methodologies for THz probing.

The TH150-THZ can be configured with MPI’s advanced RF accessories such as, RF MicroPositioners, RF cables, calibration substrates and TITAN™ RF probes to ensure precise and accurate RF measurements. With integration of the VNA extenders closer to the DUT, the MPI partnership with Rohde & Schwarz, and new advanced calibration techniques, the TS150-THZ manual probe system becomes a complete measurement solution that addresses the complexities of RF measurements at mm-wave and THz frequency ranges.

About MPI Corporation
Founded in 1995 and headquartered in Hsinchu, Taiwan, MPI Corporation is a global technology leader in Semiconductor, Light Emitting Diode (LED), Photo Detectors, Lasers, Materials Research, Aerospace, Automotive, Fiber Optic, Electronic Components and more. MPI’s four main business sectors include Probe Card, Photonics Automation, Advanced Semiconductor Test and Thermal Divisions. MPI products range from various advanced probe card technologies, probers, testers, material handlers, inspection and thermal air systems. Many of these products are accompanied by state-of-the-art Calibration and Test & Measurement software suites. The diversification of product portfolio and industries allows a healthy environment for employee growth and retention. Cross pollination of product technologies allows each new innovation to provide differentiation in areas that are meaningful to our precious customer base.

For more information please visit: www.mpi-corporation.com

Back to News
May 23rd, 2016|AST-NEWS|

MPI Corporation Introduces a New Fully-Automatic Probe System for RF Production Test

Taiwan, May 6th, 2016 – As the 200 mm wafer test market continues to expand, MPI Corporation is introducing a new fully automatic wafer probe system. The TS2500-RF addresses multiple production test market requirements which include Radio Frequency (RF) communication devices and discrete passive components. The system is based on the industry leading and highly reliable automatic LED probe systems from MPI’s Photonic Automation Division with 1000’s of installations worldwide. The TS2500-RF incorporates decades of experience in RF measurement techniques from the management team of MPI’s Advanced Semiconductor Test (AST) Division and leverages AST other products such as RF Probes, RF probing accessories and RF calibration software.

“MPI Corporation has quickly become the innovation leader in our served markets by introducing more than a dozen new products in a span of less than two years”, says Dr. Stojan Kanev, the General Manager of AST Division. “With the TS2500-RF, we are addressing the widely expanding production test market of RF communication devices and discrete RF passive components. We will continue our focus upon innovations and synergies between all MPI divisions to provide maximum value for served markets and to reinforce MPI mission to reduce the overall cost of test.”

Available for both ambient and/or hot temperature operation modes, the TS2500-RF can reach maximum speeds of 10 Dies/second (depends on configuration) which makes it an ideal choice for production electrical tests on discrete RF devices. The unique design of MPI wafer chucks and wafer lift pins can safely handle wafers with thickness down to 50 micrometers and thus enable testing of challenging thin III-Vs compound wafers. Advanced alignment features such as off-axis and chuck mounted upper-looking cameras make the TS2500-RF an ideal platform for testing within complex RF measurement configurations.

The TS2500-RF can be configured with MPI’s advanced RF accessories such as, RF MicroPositioners, RF cables, calibration substrates and TITAN™ RF probes to ensure precise and accurate RF measurements. With integration of the Vector Network Analyzers (VNA) closer to the DUT, the MPI partnership with Rohde & Schwarz, and new advanced calibration techniques, the TS2500-RF fully-automatic probe system becomes a complete measurement solution that addresses the complexities of RF production test.

About MPI Corporation
Founded in 1995 and headquartered in Hsinchu, Taiwan, MPI Corporation is a global technology leader in Semiconductor, Light Emitting Diode (LED), Photo Detectors, Lasers, Materials Research, Aerospace, Automotive, Fiber Optic, Electronic Components and more. MPI’s four main business sectors include Probe Card, Photonics Automation, Advanced Semiconductor Test and Thermal Divisions. MPI products range from various advanced probe card technologies, probers, testers, material handlers, inspection and thermal air systems. Many of these products are accompanied by state-of-the-art Calibration and Test & Measurement software suites. The diversification of product portfolio and industries allows a healthy environment for employee growth and retention. Cross pollination of product technologies allows each new innovation to provide differentiation in areas that are meaningful to our precious customer base.

For more information please visit: www.mpi-corporation.com

Back to News
May 6th, 2016|AST-NEWS|

MPI Corporation Supports National Chip Implementation Center with Donation of 200 mm Probe System to Endeavor Academia Development of IC’s

Taiwan, November 30th, 2015 – The world-leading Probe Card and Advanced Semiconductor Test Solutions provider, MPI Corporation, announced their commitment to support the National Chip Implementation Center (CIC), the leading laboratory and incubator under National Applied Research Laboratories (NARL) for IC/System design, research, and service in Taiwan. The commitment includes the donation of a 200 mm Manual Engineering Probe System – the TS200 – for a variety of applications such as Device Characterization and Modeling, Wafer Level Reliability, Failure Analysis, IC Engineering and MEMS. On behalf of MPI Corporation, Scott Kuo, the President of MPI, donated the probe system to CIC at the donation ceremony which took place in CIC. Liang-Hung Lu, the Director General of CIC, was on hand to accept the donation and reciprocated the Certificate of Appreciation to MPI.

MPI Corporation was founded in 1995 and has enjoyed undisputed worldwide recognition for probe card technology among foundries and testing houses due to an infusion between customer centricity, the latest technology development, advanced manufacturing techniques and world class customer support. The donated MPI TS200 not only supports on-wafer measurements up to 8”, the system also includes MPI’s  high magnification microscope which enables CIC engineers to precisely observe the Device Under Test (DUT) in a timely and efficient fashion. In the meantime, the unique air-bearing stage design with single-handed puck control provides unsurpassed speed in XY-axis positioning and wafer loading. Along with many other unique features, the flexibilities of the TS200 help CIC provide quality measurements to fulfill a wide range of customer requirements and enhance its chip fabrication and measurement services.

During the donation ceremony, MPI President, Scott Kuo, expressed appreciation for the dedication ceremony and looked forward to future collaboration and experience sharing, with both academia and the semiconductor industry, towards measurement interface perfection. Tzi-Dar Chiueh, the Vice President of NARL, encouraged the cooperation and also looked forward to CIC serving more academia talents with the MPI TS200 and cultivating top technologies for the Taiwan IC design industry.

Other ceremony participants include: Yung-Chin Liu, Vice President of MPI; Stojan Kanev, General Manager of MPI Advanced Semiconductor Test Division; Keng-Sheng Chang, Sales Manager of MPI Advanced Semiconductor Test Division; Steven Chan, President of Chain-Logic International Corporation (an MPI affiliate); Jiann-Jenn Wang and Hsie-Chia Chang, Deputy Director General of CIC; Da-Chiang Chang, Director of CIC Chip Implementation Service Division, and many other CIC managers.

200 mm Manual Engineering Probe System
Scott Kuo(left), the President of MPI Corporation, presented the 200 mm Manual Engineering Probe System donation to Liang-Hung Lu(right), the Director General of CIC

Reciprocated with the Certificate of Appreciation
Liang-Hung Lu(right), the Director General of CIC reciprocated with the Certificate of Appreciation to Scott Kuo(left), the President of MPI Corporation

MPI Advanced Semiconductor Test Division & CIC
Pictured from left:Keng-Sheng Chang, Sales Manager of MPI Advanced Semiconductor Test Division; Yung-Chin Liu, Vice President of MPI; Steven Chan, President of Chain-Logic International Corporation; , Stojan Kanev, General Manager of MPI Advanced Semiconductor Test Division; Scott Kuo, President of MPI; Tzi-Dar Chiueh, the Vice President of NARL; Liang-Hung Lu, the Director General of CIC; Jiann-Jenn Wang and Hsie-Chia Chang, Deputy Director General of CIC; Da-Chiang Chang, Director of CIC Chip Implementation Service Division

MPI Corporation visited CIC RF and MEMS Testing Laboratories
MPI Corporation visited CIC RF and MEMS Testing Laboratories

*Photographs courtesy of CIC
Back to News
December 18th, 2015|AST-NEWS|

R&S Demo MPI Wafer Testing System at EuMW 2015

Back to News
September 16th, 2015|AST-NEWS|

MPI Corporation and Rohde & Schwarz Offer Joint Solutions for On-Wafer Measurements on Semiconductor Components

MPI Corporation and Rohde & Schwarz offer joint solutions for on-wafer measurements on semiconductor components
September 8, 2015

Taiwan, Hsinchu – MPI is partnering with the T&M equipment manufacturer Rohde & Schwarz to provide customers with turnkey solutions for measurements on semiconductor components in the RF and millimeter wave ranges. The two companies successfully achieved a seamless integration of Rohde & Schwarz vector network analyzers (VNA) and MPI engineering probe systems.

Due to the complex measurement tasks to be performed when characterizing modern RF semiconductor components, the proper integration of T&M equipment with a probe system is a time-consuming and costly task. To set up a measurement system delivering accurate and repeatable results can be very challenging since a number of factors play a role here. These include an intuitive user interface, the mechanical properties of the probe system, the electrical and mechanical properties of the RF probe tips, the mechanical connection and integration of the network analyzer with the probe system, as well as the functionality and usability of the software. The VNA must provide the RF performance and functionality required for complete and accurate characterization even of demanding DUTs such as amplifiers and converters over a wide frequency range.
Thanks to a profound understanding of the requirements and special aspects to be considered for on-wafer RF and millimeter-wave measurements, MPI successfully brings diverse innovative solutions to the market:
MPI’s engineering probe systems are characterized by excellent mechanical stability and offer unique solutions in terms of measurement repeatability and usability.
MPI recently announced the industry‘s first probe system specifically designed for high-precision measurements in the millimeter- and submillimeter-wave (THz) ranges based on a seamless integration of Rohde & Schwarz millimeter-wave converters.
Unlike any other RF probes on the market, MPI TITAN™ RF probes provide excellent, real-time visibility of the probe tip contacts for highly accurate positioning of the probes.
MPI’s intuitive QAlibria™ calibration software with multi-touch functionality supports the Rohde & Schwarz R&S®ZVA and R&S®ZNB VNAs. These offer a wide output power range for the characterization of active components in the linear and non-linear regions. Featuring highly stable sources, the R&S®ZVA in conjunction with Rohde & Schwarz frequency converters is ideally suited for on-wafer component characterization in the millimeter-wave range. The Rohde & Schwarz frequency converters have been optimized mechanically for on-wafer measurements.

About MPI Corporation

MPI Corporation is a publicly held company, founded in July, 1995. In 20 short years MPI has already achieved the #1 position for probe card manufacturing in Taiwan and #5 globally. In addition, MPI is the undisputed world leader in production LED material handling, test and inspection by having more than 9000 systems installed. MPI’s Advanced Semiconductor Test (AST) division is built on a unique combination of manufacturing excellence and systems reliability from the LED division combined with more than 50 years of engineering probe systems market expertise within the management and marketing team. The major focus of the AST division is in test solutions for applications such as RF and mmW, and device characterization for modeling and process development.
For more information visit: www.mpi-corporation.com

About Rohde & Schwarz

The Rohde & Schwarz electronics group offers innovative solutions in the following business fields: test and measurement, broadcast and media, secure communications, cybersecurity, radio monitoring and radiolocation. Founded more than 80 years ago, this independent company has extensive sales and service networks and is present in more than 70 countries. The electronics group is among the world market leaders in its established business fields. On June 30, 2014, Rohde & Schwarz had approximately 9800 employees. It achieved a net revenue of EUR 1.75 billion in the 2013/2014 fiscal year (July to June). The company is headquartered in Munich, Germany. It also has regional headquarters in Singapore and Columbia, Maryland, USA, to manage its operations in these regions.
For more information visit: www.rohde-schwarz.com

Back to News
September 8th, 2015|AST-NEWS|

The Future Starts Now – the New Automated Engineering Probe System

MPI Corporation announces its new Automated Engineering Probe System at IEEE MTT-S IMS 2015!

Measure the Difference

The TS2000-SE from MPI is the first ever 200mm automated engineering probe system on the market integrating innovative features specifically designed to reduce the cost of test:

  • Automated single wafer loader
  • Vertical control environment (VCE)
  • Hot/cold wafer swaps at set temperatures
  • Safety test management system
  • Vibration and thermal control

These features are incorporated into the MPI ShielDEnvironment™ for ultra-low noise, very accurate and highly reliable DC/CV, RF and High Powermeasurements.

Feel the Difference

The system is controlled by the unique and revolutionary, multi-touch operation Software Suite named SENTIO™ – simple and intuitive operation saves significant training time, the Scroll, Zoom, Move commands mimic mobile devices and allows everyone to become an expert in just minutes. For RF applications there is no need to switch to another software platform – the MPI RF calibration software program QAlibria ™ is fully integrated – for ease of use by following a single operational concept methodology.

MPI Advanced Semiconductor Test Division

offers complete Test Solutions based on a variety of engineering probe systems, RF probes from 26 to 110 GHz, and QAlibria™ – the unique RF calibration software. Major focus is on applications such as RF and mmW, Device Characterization for Modeling and process development, High Power, and many other complex applications.

Back to News
May 17th, 2015|AST-NEWS|