• November 27, 2015
  • Grand Hi-Lai Hotel, Kaohsiung, Taiwan (高雄漢來飯店)
  • Please come join thejoint-workshop in Room Golden Phoenix, 9F (金鳳廳)

This workshop is being held in corporation with Rohde & Schwarz Taiwan.→Register Now

[Subject:] Relentless Innovations for un-compromising measurement accuracy of sub-mm wave IC's at the wafer-level
[Abstract:]Challenges when obtaining accurate, reliable and repeatable measurement results of sub-mm wave ICs at the wafer-level drastically increases with the frequency. Complexity of the measurement setup and its calibration, the need for data obtained for multiple frequency bands and unacceptably high signal loss in transmission media push for relentless innovations.
In this presentation, we will discuss new approaches of integration a sub-millimetre wave VNA with the probe system into a complete measurement solution. The unique design of the probe system enabled highest possible measurement dynamic range without compromising on mechanical stability, as well as simple and fastest system reconfiguration for different frequency bands. Special attention will be given to the system calibration and solutions for eliminating complexity of the calibration task, reducing mistakes and minimising calibration residual errors.
[Presenter:]Dr. Andrej Rumiantsev (Co-Presenter: Cyrus Chiu)
[Time:]13:20 - 14:20, Friday, November 27th, 2015