WS-VN04 – Innovations to increase measurement accuracy of sub-mm wave ICs at the wafer level
Challenges in obtaining accurate, reliable and repeatable measurement results on submillimeter wave ICs at the wafer level drastically increase with frequency. The complexity of the measurement setup, calibration difficulties, the need to obtain data for multiple frequency bands and the unacceptably high signal loss in transmission media push engineers to come up with innovative solutions.
In this presentation, we will discuss new approaches for integrating a submillimeter wave R&S®ZVA vector network analyzer with probe system into a complete test solution. Special attention will be given to system calibration and solutions for eliminating complexity in the calibration task, reducing mistakes and minimizing calibration residual errors.