• October 8, 2017
  • Nürnberg Convention Center, Germany
  • Please come join the workshop in Room Neu Delhi on Level 3, NCC Ost.
  • 參加部門: Advanced Semiconductor Test
WS-14: Modelling, Identification and Suppression of Parasitic Modes in On-Wafer Measurements  Register Now

Subject:Minimising Sources of Errors in Wafer-Level Measurements at Sub-mm Wave Frequencies: What we’ve learned so far
Presenter:Dr. Andrej Rumiantsev
Time:9:00 - 9:30, Sunday, October 8