最新活動 Archives - MPI Corporation

SEMICON WEST 2017

March 20th, 2017|最新活動|

Spring MOS-AK Workshop at DATE

  • March 31, 2017
  • Swisstech Convention Centre, Lausanne, Switzerland
  • Please come join the first afternoon workshop:
    “New Approach to Reduce Time-to-data when Characterizing Advanced Semiconductor Devices” by Dr. Andrej Rumiantsev
  • 參加部門: Advanced Semiconductor Test
March 13th, 2017|最新活動|

30th IEEE International Conference on Microelectronic Test Structures (ICMTS)

  • Exhibition on March 28-30, 2017
  • Maison MINATEC, Grenoble, France
  • Please visit us in the room Titane
  • Participating Division: Advanced Semiconductor Test
February 6th, 2017|最新活動|

SEMICON CHINA 2017

February 6th, 2017|PCBU-News & Events, 最新活動|

Asia-Pacific Microwave Conference 2016

  • Exhibition on December 6-8, 2016
  • Hotel Pullman, Aerocity, New Delhi, India
  • Please visit us in Peacock Ballroom
  • 參加部門: Advanced Semiconductor Test
November 10th, 2016|最新活動|

R&S 5G Innovation Summit 2016

  • November 29, 2016 in DoubleTree by Hilton San Diego – Del Mar, CA, USA
  • December 1, 2016 in Biltmore Hotel & Suites – Santa Clara, CA, USA
  • Please come join the joint-workshop
  • 參加部門: Advanced Semiconductor Test
An workshop is being held in corporation with Rohde & Schwarz USA. Register Now
November 10th, 2016|最新活動|

European Microwave Week 2016

September 2nd, 2016|最新活動|

ESSCIRC – ESSDERC 2016

  • Exhibition: September 12 – 15, 2016; Workshop: September 12, 2016
  • Swisstech Convention Centre, Lausanne, Switzerland
  • Please visit our booth and join the workshop at Room 2A
  • 參加部門: Advance Semiconductor Test
R&S / MPI Workshop: Cutting-Edge Modeling and Measurement Techniques Addressing Challenges of 5G Circuits and Systems
This workshop is held in corporation with Rohde & Schwarz.

[Subject]:Wafer-Level Calibration and Measurements at mm-Wave Frequencies
[Abstract]:Accurate calibration of the entire wafer-level measurement system to the RF probe tip end or to the intrinsic device terminals is a critical success factor for extracting trustable device model parameters and characterizing true performance of a RF IC. This presentation will start with the basics of S-parameter measurement and calibration techniques at the wafer-level. Special attention will be paid to how to choose the right calibration method for specific measurement application needs. Finally, the potential sources of calibration residual errors will be analyzed. Practical examples will be given on how to minimize the impact of such errors on the measurement accuracy of a calibrated probe system.
[Presenter]:Dr. Andrej Rumiantsev
[Time]:10:40 – 11:30, Monday, September 12, 2016
September 2nd, 2016|最新活動|

SEMICON Taiwan 2016

  • Exhibition on September 07 – 09, 2016
  • Taipei Nangang Exhibition Center, Taipei, Taiwan
  • Please visit us at Booth No. 2522.
  • 參加部門: Thermal Test
September 2nd, 2016|最新活動|

High Frequency/Speed Layout Seminar

  • Exhibition: August 22, 2016 (12:50~16:00)
  • No.22, Jhonghua Rd., Hukou Township, Hsinchu County, Taiwan
  • Please visit us at Hsinchu Industrial Park Service Center , Convention Room
  • 參加部門: Probe Card Technologies
August 22nd, 2016|PCBU-News & Events, 最新活動|