最新活動 Archives - MPI Corporation 最新活動 Archives - MPI Corporation

Automotive Testing Expo 2018

  • Exhibition on: October 23-25, 2018
  • Hall B, The Suburban Collection Showplace, Novi, MI, USA
  • Please visit us at Booth No. 8034
  • 參加部門: Thermal Test
September 4th, 2018|最新活動|

Laser Taiwan 2018

  • Exhibition on: October 17-19, 2018
  • Hall 1, TWTC Nangang Exhibition Center, Taipei, Taiwan
  • Please visit MPI in VCSEL 3D Sensing Pavilion
  • 參加部門: Photonics Automation
September 4th, 2018|最新活動|

European Microwave Week 2018

  • Exhibition on September 25-27, 2018
  • Ifema Feria de Madrid, Madrid, Spain
  • Please visit us at Booth No. 22
  • 參加部門: Advanced Semiconductor Test
July 19th, 2018|最新活動|

China International Optoelectronic Expo (CIOE)

  • Exhibition on: September 5-8, 2018
  • Shenzhen Convention & Exhibition Center, Shenzhen, China
  • Please visit us at Booth No. 2538、2539 (Hall 2)
  • 參加部門: Thermal Test
July 19th, 2018|最新活動|

SEMICON TAIWAN 2018

July 19th, 2018|最新活動|

ESSCIRC – ESSDERC 2018

  • September 3, 2018
  • Please come join the Luncheon at Zeltschlösschen (Nürnberger Straße 55, Dresden), Germany
  • 參加部門: Advance Semiconductor Test
The Luncheon is sponsored by Rohde & Schwarz. Please register for this event while registering for the Conference.

[Subject]:Pioneering Solutions for Wafer-Level Device, IC and System Characterization in the mmWave Range and Beyond
[Presenter]:Andreas Henkel, Product Manager Vector Network Analysis, Rohde & Schwarz GmbH & Co. KG
Andrej Rumiantsev, Director RF Technologies, MPI Corporation
[Abstract]:The automotive radar, self-driving cars and 5G applications are the key driving forces to extend semiconductor technologies to higher frequencies and bandwidths. Even in the mobile communications, frequency ranges up to 70 GHz to 80 GHz and beyond are considered for handheld devices or backhaul systems. However, challenges of obtaining accurate measurement results increase exponentially with the frequency range: active devices require precisely calibrated stimuli for magnitude, phase and power at the device level, e.g. to perform calibrated compression point measurements. Moreover, the majority of characterization tasks should be executed at the wafer-level. This drastically increases the complexity of the integrated measurement systems.

The workshop will start with an overview of specific requirements for measurement and calibration techniques. Later, we will introduce pioneering solutions for mm-wave device characterization, ICs and system measurements at the wafer-level: e.g. for on-chip antenna characterization as well as for THz measurements. Based on experience and expertise of R&S and MPI, complex and fully-integrated solutions were developed to help engineers obtaining most accurate and reliable results with highest confidence and in shortest time.

Attendees will also have an unique opportunity for a Q&A session with technology experts in informal way during the event.
[Time]:12:30 pm - 2:00 pm, Monday, September 3, 2018
July 18th, 2018|News, 最新活動|

ECSCRM 2018

  • September 2 – 6, 2018
  • The International Conference Centre, Birmingham, UK
  • Please visit our booth at C6, L4 (Hall 3)
  • 參加部門: Advanced Semiconductor Test
July 18th, 2018|最新活動|

International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

  • Exhibition on: July 17-19, 2018
  • Marina Bay Sand Expo and Convention Centre, Singapore
  • Please visit us at Booth No. 21
  • 參加部門: Advanced Semiconductor Test
June 5th, 2018|最新活動|

Semicon West 2018

  • Exhibition on July 10-12, 2018
  • Moscone Center, San Francisco, CA, USA
  • Please visit us at Booth No. 6169 in North Hall
  • 參加部門: Probe Card Technologies | Thermal Test
June 3rd, 2018|PCBU-News & Events, 最新活動|

UK Semiconductors 2018

May 5th, 2018|最新活動|