最新活動 Archives - MPI Corporation

MPI Corporation Opens Subsidiary in U.S.A.

Taiwan, April 15th, 2017 – MPI Corporation is proud to announce the grand opening of its subsidiary MPI America in the United States. MPI has demonstrated clear leadership in recent years developing numerous and very significant innovations while serving customers in the semiconductor test market. MPI continues its leadership position and global expansion with the opening of MPI America, Inc. which includes a fully staffed facility with resources for sales, customer service, field service, repair, and a spare parts depot. Located in San Jose, CA. MPI America is a reflection of MPI Corporation’s commitment to customer centricity and product innovation resulting in meaningful reductions to the cost of semiconductor test….[More]
April 27th, 2017|最新活動|

SEMICON WEST 2017

April 7th, 2017|最新活動|

89th ARFTG Microwave Measurement Symposium

March 30th, 2017|最新活動|

IEEE MTT-S International Microwave Symposium 2017

March 30th, 2017|最新活動|

IEEE Semiconductor Wafer Test Workshop

  • June 4-7, 2017
  • Rancho Bernardo Inn, San Diego, CA, USA
  • Please visit us at Booth No. 9
[Presentation]: MEMS process on RF Probe Card
[Presenter]: Alex Wei
[Date]: Wednesday, June 07, 2017
March 14th, 2017|PCBU-News & Events, 最新活動|

The 29th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

  • Exhibition on May 29 – 31,  2017
  • Royton Sapporo, Hokkaido, Japan
  • Please visit us at Booth No. 16, in the Lobby on 3F
  • 參加部門: Advanced Semiconductor Test
March 14th, 2017|最新活動|

Spring MOS-AK Workshop at DATE

  • March 31, 2017
  • Swisstech Convention Centre, Lausanne, Switzerland
  • Please come join the first afternoon workshop:
    “New Approach to Reduce Time-to-data when Characterizing Advanced Semiconductor Devices” by Dr. Andrej Rumiantsev
  • 參加部門: Advanced Semiconductor Test
March 13th, 2017|最新活動|

ADVANTEST DEVELOPER CONFERENCE 2017

  • Exhibition on May 16-17, 2017
  • Hyatt Regency Indian Wells Resort & Spa (Indian Wells Ballroom)
  • Please visit us at Booth No.12
  • 參加部門: Probe Card Technologies
  • Exhibition on May 26, 2017
  • Intercontinental Shanghai Pudong
  • Please visit us at Booth No.5
  • 參加部門: Probe Card Technologies
March 13th, 2017|PCBU-News & Events, 最新活動|

30th IEEE International Conference on Microelectronic Test Structures (ICMTS)

  • Exhibition on March 28-30, 2017
  • Maison MINATEC, Grenoble, France
  • Please visit us in the room Titane
  • Participating Division: Advanced Semiconductor Test
February 6th, 2017|最新活動|

SEMICON CHINA 2017

February 6th, 2017|PCBU-News & Events, 最新活動|