dlab_admin, Author at MPI Corporation dlab_admin, Author at MPI Corporation

About dlab_admin

This author has not yet filled in any details.
So far dlab_admin has created 47 blog entries.

European Microwave Week 2015

  • September 8 – 10, 2015
  • Palais Des Congrès de Paris, Paris, France
  • Please visit us at Booth No. 237.
Technical Workshop – This workshop is being held in corporation with Rohde & Schwarz. Register Now

Subject:WS-VN04 – Innovations to increase measurement accuracy of sub-mm wave ICs at the wafer level
Abstract:Challenges in obtaining accurate, reliable and repeatable measurement results on submillimeter wave ICs at the wafer level drastically increase with frequency. The complexity of the measurement setup, calibration difficulties, the need to obtain data for multiple frequency bands and the unacceptably high signal loss in transmission media push engineers to come up with innovative solutions.
In this presentation, we will discuss new approaches for integrating a submillimeter wave R&S®ZVA vector network analyzer with probe system into a complete test solution. Special attention will be given to system calibration and solutions for eliminating complexity in the calibration task, reducing mistakes and minimizing calibration residual errors.
Presenter:Dr. Andrej Rumiantsev
Time:14:45 - 15:45, Thursday, Sept 10, 2015
June 9th, 2015|最新活動|

NanoTR 11 Conference

  • June 23 – 25, 2015
  • Middle East Technical University, Ankara, Turkey
  • Please visit us at Cultural and Convention Center​.
June 8th, 2015|最新活動|

MPI’s Participation in SWTW2015

MPI Corporation is honored to announce our participation in the 25th annual Semiconductor Wafer Test Workshop starting June 7th, 2015 at the Rancho Bernardo Inn, San Diego, CA.

On Monday afternoon, MPI’s Alex Wei will present a 12Gbps loopback solution for high speed digital test applications along with perspectives presented at the panel discussion by Rob Carter on Cantilever developments for improved cost-effective tests and longevity.

Of course your SWTW visit would not be complete without seeing us face-to-face so please don’t forget to stop by MPI’s booth to receive the most up to date information on how MPI can help your organization be more competitive.

Please add the following to your calendar:

  1. Technical Presentation:
    Subject:An innovative Design & Implement of Vertical Probe Card for Hi-Speed Loopback (12Gbps) Application
    Presenter:Alex Wei, Section Manager, R&D Division.
    Time:1.00 PM, Monday, Aragon Conference Room
  2. Panel Discussion: [Title, Panelist, Subject Brief Description ]
    Subject:Panel 1: How Will Cantilever Go Further?
    Panel 2: High Parallel Micro Bump Probing, Is There A Real Need? What Would Be The Challenges?
    Panelist:Rob Carter, VP of Corporate Marketing, MPI
    Time:3.30 PM, Monday, Aragon Conference Room
  3. MPI Exhibition: [Booth #]
    Booth #:Number 2, near to entrance of Expo Hall.
    Time:Open from 5.00 PM, Monday

About MPI

MPI Corporation was founded in July, 1995 and has enjoyed growth well beyond industry standards due to an infusion between customer centricity, industry leading technology development, advanced manufacturing techniques and world class customer support. MPI’s four main product lines include state of the art Wafer Test Probe Cards, Production LED Equipment, Advanced Semiconductor Test Equipment and Thermal Air solutions. The industries MPI serves include Semiconductor, Materials Research, Aerospace, Automotive, Fiber Optic, Electronic Components, Bio-Research, and more. Cross pollination of product technologies allows each new innovation to provide differentiation in areas that are meaningful to the markets we serve. MPI is the only publically owned, GTSM-listed company of its kind in Taiwan. For more information visit www.mpi-corporation.com

Press Contactor:

May 29th, 2015|PCBU-News & Events|

The Future Starts Now – the New Automated Engineering Probe System

Press Release

May 2015

The Future Starts Now – the New Automated Engineering Probe System

MPI Corporation announces its new Automated Engineering Probe System at IEEE MTT-S IMS 2015!

Measure the Difference

The TS2000-SE from MPI is the first ever 200mm automated engineering probe system on the market integrating innovative features specifically designed to reduce the cost of test:

  • Automated single wafer loader
  • Vertical control environment (VCE)
  • Hot/cold wafer swaps at set temperatures
  • Safety test management system
  • Vibration and thermal control

These features are incorporated into the MPI ShielDEnvironment™ for ultra-low noise, very accurate and highly reliable DC/CV, RF and High Powermeasurements.

“TITAN™ Probes represent the next generation of high frequency probes and are a direct replacement for all Allstron probes. With drastically improved performance, TITAN™ Probes create tremendous market impact due to a reduction of cost of test. In particular, TITAN™ Probe family includes the high-power model that enables testing of active and/or passive RF high power devices at 10 W of continuous power, DC currents up to 2 A, bias voltages up to 250 V and at the temperature range from -60 C to +200 С.

This is MPI’s unique value to the rapidly developing market of high-power RF applications ” says Stojan Kanev, the General Manager of Advanced Semiconductor Test Division. “TITAN™ Probes will provide customers a valuable method to improve their ROI when developing modern RF and microwave components.”

Feel the Difference

The system is controlled by the unique and revolutionary, multi-touch operation Software Suite named SENTIO™ – simple and intuitive operation saves significant training time, the Scroll, Zoom, Move commands mimic mobile devices and allows everyone to become an expert in just minutes. For RF applications there is no need to switch to another software platform – the MPI RF calibration software program QAlibria ™ is fully integrated – for ease of use by following a single operational concept methodology.

MPI Advanced Semiconductor Test Division
offers complete Test Solutions based on a variety of engineering probe systems, RF probes from 26 to 110 GHz, and QAlibria™ – the unique RF calibration software. Major focus is on applications such as RF and mmW, Device Characterization for Modeling and process development, High Power, and many other complex applications.

In-White-41px-R  www.mpi-corporation.com
Back to News
May 17th, 2015|AST-NEWS|

IEEE Semiconductor Wafer Test Workshop

  • June 7 – 10, 2015
  • Rancho Bernardo Inn, San Diego, CA, USA
  • Please visit us at Booth No. 2.

Session #3
An innovative design and implement of vertical probe card for High Speed Loopback(12Gbps) Application

[Presenter]: Alex Wei
[Date]: Monday, June 08, 2015
May 16th, 2015|PCBU-News & Events|

ARFTG 85th Microwave Measurement Conference

  • May 22, 2015
  • Hyatt Regency Phoenix, AZ, USA
  • Please visit us at Hyatt Regency Hotel.
May 15th, 2015|最新活動|

IEEE MTT International Microwave Symposium 2015

  • May 19 – 21, 2015
  • Phoenix Convention Center, AZ, USA
  • Please visit us at Booth No. 1434.
May 15th, 2015|最新活動|

The 27th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

  • May 11 – 14, 2015
  • Please visit us at Booth No. 8 at Foyer, Lower Level 1.
May 15th, 2015|最新活動|

Expo Electronica 2015

  • March 24 – 26, 2015
  • Complex Crocus Expo, Moscow, Russia
  • Please visit us at Booth No. 733.
May 15th, 2015|最新活動|

28th IEEE International Conference on Microelectronic Test Structures (ICMTS)

  • March 23 – 26, 2015
  • DoubleTree by Hilton Hotel Phoenix Tempe, AZ, USA
  • Please visit us at upper lobby in front of the Fiesta Ballroom I & II.
May 15th, 2015|最新活動|